2014
DOI: 10.1021/am503844u
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Impact of Copper Overpressure on the Synthesis of Hexagonal Boron Nitride Atomic Layers

Abstract: Hexagonal boron nitride (h-BN) atomic layers are synthesized on polycrystalline copper foils via a novel chemical vapor deposition (CVD) process that maintains a vapor-phase copper overpressure during growth. Compared to h-BN films grown without a copper overpressure, this process results in a >10× reduction of 3-dimensional BN fullerene-like surface features, a reduction of carbon and oxygen contamination of 65% and 62%, respectively, an increase in h-BN grain size of >2×, and an 89% increase in electrical br… Show more

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Cited by 21 publications
(18 citation statements)
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“…In addition, it is worth to note that these smaller devices have similar leakage current at lower bias compared with those based on mechanically exfoliated BN films 41 . The hard breakdown phenomenon can be observed in the range of 3.0~3.3 MV/cm, which is comparable with the values from the devices based on h-BN films grown by CVD 8 11 42 and exfoliated h-BN films 43 . In addition to the vertical electrical characterizations, in-plane electrical characterizations were also carried out on a transferred h-BN thin film of Sample D on SiO 2 ( Figure S5 ).…”
Section: Resultssupporting
confidence: 84%
“…In addition, it is worth to note that these smaller devices have similar leakage current at lower bias compared with those based on mechanically exfoliated BN films 41 . The hard breakdown phenomenon can be observed in the range of 3.0~3.3 MV/cm, which is comparable with the values from the devices based on h-BN films grown by CVD 8 11 42 and exfoliated h-BN films 43 . In addition to the vertical electrical characterizations, in-plane electrical characterizations were also carried out on a transferred h-BN thin film of Sample D on SiO 2 ( Figure S5 ).…”
Section: Resultssupporting
confidence: 84%
“…66 The faint striations running diagonally from upper right to lower left are attributed to thermally induced wrinkles in the h-BN overlayer. 13,16,32,36,67 Figure 1b Figure S3 and S4. Figure 2a shows an h-BN film grown at PTOT = 1.2 Torr (LPCVD regime); the film edge is indicated by the dashed, blue line.…”
Section: Resultsmentioning
confidence: 99%
“…It is possible to be viewed in Figure 2H for monolayer, drifts to higher wave number of 1370 cm −1 noticed due to the Raman peak broadens and when it compared with the bulk, which is 1366 eV. This study evidently flaunts BNNS formation through the red shift, which could be used later as standard to ensure BNNS presence [9].…”
Section: Structural Properties Of H-bnmentioning
confidence: 73%