Impact of Charge Migration and the Angle-Resolved Photoionization Time Delays of the Free and Confined Atom X@C60

Abstract

The present study is devoted to isolate and study the effect of charge migration on the photoionization from the X@C60. The noble gas atoms, Ar, Kr, and Xe, are confined in the C60 to investigate the impact of charge migration from the entrapped atom to the C60 side. The present work concludes that the confinement oscillations in the photoionization features are amplified due to the charge migration. Further, the angle-resolved, spin average time delay is also investigated in the light of confinement. Features in the time delay due to the charge migration are more amplified relative to those in the cross-section or angular distribution.