Imbert–Fedorov shifts of a Gaussian beam reflected from anisotropic topological insulators

Goos–Hänchen and Imbert–Fedorov shifts at the interface of ordinary dielectric and topological insulator

“…(10) and (12), we find the transverse shifts l TE IF and l TM IF are nonzero and completely originate from the topologically magnetoelectric coupling interaction. This conclusion also agrees with the result obtained in [20] at the case of anisotropic TI. The transverse shifts for TE and TM incident states are shown in Fig.…”

“…We used the formula in [20] to repeat our results; it is shown that they are consistence with each other. From the content of [20], the IF shift could be enhanced or weakened by the surface current, because it is simultaneously determined by the magnetoelectric response and the damping constant in permittivity [20]. On this point, it is valuable to make a further investigation in future.…”

“…For the influence of surface current on IF shift, the authors of [20] have discussed it in detail for the anisotropic TI. We used the formula in [20] to repeat our results; it is shown that they are consistence with each other.…”

“…For the influence of surface current on IF shift, the authors of [20] have discussed it in detail for the anisotropic TI. We used the formula in [20] to repeat our results; it is shown that they are consistence with each other. From the content of [20], the IF shift could be enhanced or weakened by the surface current, because it is simultaneously determined by the magnetoelectric response and the damping constant in permittivity [20].…”

“…The GH and IF shifts have attracted considerable attention in theoretical and experimental works for many years, since they not only depend upon the incident polarized states and on the material composition of the interface [15,18] but also may become promising in telecommunication devices with the dimension of the order of wavelength in the future [19]. Very recently, Xu et al [20] have reported IF shifts of a reflected Gaussian beam from anisotropic TI with two types of surface perturbations, based on a general beampropagation model [21]. Comparing with their work, here we mainly derive the general formulas of GH and IF shifts of beam incident from ordinary dielectric to isotropic TI through another convenient and straightforward way, i.e., Yasumoto and Oishi's energy flux method (EFM).…”