1987
DOI: 10.1002/sia.740100504
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Imaging XPS—a new technique. 2—Experimental verification

Abstract: The XPS image is obtained by the dissection of the surface area of interest into a series of adjacent narrow strips. The width of the entrance slit system of the energy analyzer gives the strip width and a translational movement of the specimen makes it possible to investigate the total number of strips step by step. By means of the double focusing properties of the spherical analyzer the energy spectrum from each point (spot) of the strip area under observation is available on the detector focal plane. Specif… Show more

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Cited by 19 publications
(1 citation statement)
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“…67 We also employed XPS spectromicroscopy to analyze the underlying growth mechanism of the SEI layer, which can provide realistic views of concentration gradients in the spatial domain. 68,69 Figure 4 shows a two-dimensional chemical imaging performed at the same spot on the Li-anode after the first charge/discharge process (see the Supporting Information). The interfacial region (800 × 800 μm) is scanned at 685 eV (F 1s; Li−F species) and 163.3 eV (S 2p; S B 0 ) binding energies to monitor the TFSI anion and polysulfide gradient with a spatial resolution of about 5 μm.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…67 We also employed XPS spectromicroscopy to analyze the underlying growth mechanism of the SEI layer, which can provide realistic views of concentration gradients in the spatial domain. 68,69 Figure 4 shows a two-dimensional chemical imaging performed at the same spot on the Li-anode after the first charge/discharge process (see the Supporting Information). The interfacial region (800 × 800 μm) is scanned at 685 eV (F 1s; Li−F species) and 163.3 eV (S 2p; S B 0 ) binding energies to monitor the TFSI anion and polysulfide gradient with a spatial resolution of about 5 μm.…”
Section: ■ Results and Discussionmentioning
confidence: 99%