1973
DOI: 10.1080/14786437308226892
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Imaging of uranium atoms with the electron microscope by phase contrast

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Cited by 19 publications
(2 citation statements)
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“…5k). 44,53 Prior to the development of aberration correctors it was difficult, although not impossible, 54,55 to monitor the behaviour of single atom contaminants in a specimen. However, with the successful isolation of few-layer graphene sheets it became possible to prepare almost ideal electron microscopy samples, 56 permitting the high-resolution imaging of material on the graphene surface.…”
Section: Adatoms Substitutions and Interstitialsmentioning
confidence: 99%
“…5k). 44,53 Prior to the development of aberration correctors it was difficult, although not impossible, 54,55 to monitor the behaviour of single atom contaminants in a specimen. However, with the successful isolation of few-layer graphene sheets it became possible to prepare almost ideal electron microscopy samples, 56 permitting the high-resolution imaging of material on the graphene surface.…”
Section: Adatoms Substitutions and Interstitialsmentioning
confidence: 99%
“…Some of these claims were made by Crewe (1970Crewe ( a,b, 1974; Hashimoto (1971Hashimoto ( , 1974; Henkelman andOttensmeyer (1971, 1973); Formannek (1971); Baumeister and -4-and Hahn, (1973); and Parsons (1973Parsons ( , 1974. The justifications for atom images have mostly been based on the agreement between the experimental and theoretical contrast estimates and/or the agreement between the measured and the assumed distances of the heavy atoms in an organo-metallic compound.…”
Section: (D) Claims Of Single Atom Images and Shortcomings In The Evimentioning
confidence: 99%