“…To date, several optical techniques have been successfully applied for ferroelectric domain characterization and inspection, such as Raman spectroscopy [13,14], electrooptical near-field microscopy [15], defect-luminescence microscopy [16], near-field second-harmonic generation (SHG) * thomas.kaempfe@iapp.de microscopy [17], nonlinear Talbot imaging [18], optical coherence tomography [19], and Cherenkov-type SHG (CSHG) [20]. Although near-field SHG and electro-optical microscopy perform at an ultrahigh resolution beyond the diffraction limit, they constitute scanning probe techniques with a high surface sensitivity but a low penetration depth.…”