Imaging of surfaces in LEED instruments

Bauer, H.; Schmid, Ron; Seiler, H.

doi:10.1088/0022-3735/15/3/007

J. Phys. E: Sci. Instrum.

1982

DOI: 10.1088/0022-3735/15/3/007

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Imaging of surfaces in LEED instruments

H. Bauer¹,

Ron Schmid²,

H. Seiler³

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1983

1989

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“…A similar survey of characterization techniques for high-energy switch materials degredation (650) shows the need for a "synergistic, interdisiplinary microanalytical approach". The characterization of 0003-2700/83/0355-133RS06.50/0 © 1983 American Chemical Society polycrystalline surfaces using ISS (75) and LEED (72) clearly shows that useful analytical information can be obtained on this analytically challenging substrate. The general area of characterization of adsorbates on solid surfaces was reviewed specifically for AES and XPS (55).…”

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confidence: 99%

Forensic science

Brettell¹,

Saferstein²

1983

Anal. Chem.

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He Joined the company in 1959 as a radiochemist. His current work is directed toward developing advanced techniques for semiconductor materials characterization using electron beam (scanning Auger) and in microprobe techniques for chemical imperfections. X-ray topography, and scanning transmission electron microscopy techniques for physical imperfections. Larrabee earned a B.Sc. from the University ol Bishop's College In Quebec and an M.Sc. in chemistry from McMaster University in Ontario, Canada. He has published in analytical, electrochemical, and instrumentation journals and contributed chaplers In books. He has coauthored a book on the characterization of semiconductor materials and coedited a book on the characterization of solid surfaces. Larrabee is a member of the ACS, Electrochemical Society, SAS, and the Dallas Society of Analytical Chemists. R. Allen Bowling received his B.S. In Chemistry from the University ol Alabama and a Ph.D. In Chemistry from ihe University of Tennessee.He held an Alexander von Humboldt postdoctoral research position at the Institute ol Inorganic Chemistry, University of Frankfurt, West Germany, from March 1979 to July 1980. He joined Texas Instruments Incorporated in September 1980 as a process control engineer in a semiconductor processing area. In January 1982, he became a member of the technical staff in the Materials Characterization Branch of the Materials Science Laboratory of Texas Instruments, where he is presently responsible for Auger and XPS instrumentation. Bowling is a member of the Electrochemical Society and the American Vacuum Society.

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confidence: 99%

Forensic science

Brettell¹,

Saferstein²

1983

Anal. Chem.

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Electron optical methods for microanalysis of surfaces

Seiler¹

1988

Surface & Interface Analysis

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Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry

Turner¹,

Dunlap²,

Colton³

1984

Anal. Chem.

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Imaging of surfaces in LEED instruments

Cited by 5 publications

References 0 publications

Forensic science

Forensic science

Electron optical methods for microanalysis of surfaces

Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry

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