Imaging of colloidal gold on graphite by scanning tunneling microscopy: Isolated particles, aggregates, and ordered arrays

Womelsdorf, J. F.; Ermler, Walter C.; Sandroff, C. J.

doi:10.1021/j100155a001

Cited by 18 publications

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“…At any stable operating point, we observed a low density of particles that were an order of magnitude shorter than expected, yet had the proper diameter. This is consistent with images obtained by others of various particles bound to substrates [15,16]. The STM appears to either be removing the particles of higher aspect ratios, or deforming those that are not removed.…”

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Scanned probe investigations of chemically derived nanostructures

et al. 1996

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We discuss the use of a conducting-tip atomic force microscope (AFM) for the imaging and electrical measurement of chemically derived nanostructures. First, scanning probe microscopy of CdSe and Au nanocrystals bound to a substrate with a self assembled monolayer will be discussed. It is found that imaging in liquids is necessary to avoid removing the nanocrystals. We then address some issues in performing electrical measurements in liquids. In particular, we examine the conducting properties of the AFM tip when imaging a flat surface, highly oriented pyrolytic graphite, in a non-polar liquid, hexadecane. We find that the solvation layers between the tip and the substrate strongly influence the electrical properties.

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