1991
DOI: 10.1143/jjap.30.2991
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Imaging Characteristics of Multi-Phase-Shifting and Halftone Phase-Shifting Masks

Abstract: We have investigated the bonding nature and hole-electron Coulomb interaction U in thin C 60 films on Be(0001) surfaces using valence-band and corelevel photoemission, inverse photoemission, and near-edge x-ray absorption spectroscopies. The C 60 monolayer had strong covalent bonding with the Be substrate, producing a nearly insulating film, in contrast to a metallic overlayer due to charge transfer observed on many other metallic surfaces. The effect of polarization of surrounding molecules and the image pote… Show more

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Cited by 79 publications
(28 citation statements)
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“…2. The three mask technologies are chromium-on-glass (COG), attenuated PSM [5], [6] and alternating PSM [4]. 4 COG is the standard mask technology in photolithography.…”
Section: Optical Enhancement Techniquesmentioning
confidence: 99%
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“…2. The three mask technologies are chromium-on-glass (COG), attenuated PSM [5], [6] and alternating PSM [4]. 4 COG is the standard mask technology in photolithography.…”
Section: Optical Enhancement Techniquesmentioning
confidence: 99%
“…Thus alternating PSM's are sometimes classified as strong PSM's whereas attenuated PSM's are classified as 4 Other types of PSM's such as rim [8] and chromeless [9] are not considered because of design and practicality issues. 5 In an actual alternating PSM, mask topography effects cause transmittance imbalance [25] which can be partially or, in some cases, totally corrected [26], [27]. weak PSM's.…”
Section: Optical Enhancement Techniquesmentioning
confidence: 99%
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“…[23 Since the calcium fluoride should be a single crystal, it is not easy to obtain large-diameter material. [3] The polishing should be different than the conventional one because of its crystal structure. Among the researchers, calcium fluoride has been one of the main topics these years.…”
Section: Materials Study Of Calcium Fluoride (Caf2)mentioning
confidence: 99%
“…Although many different configurations of multiple beams can increase image contrast, only those that satisfy certain symmetry requirements preserve the large depth of field characteristic of two beams. To make fine hole patterns, application of optical lithographic techniques such as utilizing an attenuating phase shift mask is used to enhance the resolution, 8 however, the diameter formed by this approach is restricted to 0.20 m using the KrF excimer laser. Nakao et al 9 have used phase shift masks using KrF excimer laser as exposure light to fabricate 0.1 m dense holes.…”
mentioning
confidence: 99%