Image Quality Considerations in Computerized 2-D and 3-D Microscopy

Kriete, Andres

doi:10.1007/978-1-4613-8366-6_12

Cited by 7 publications

(7 citation statements)

References 17 publications

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“…Object dependent considerations such as scatter, beam hardening in x-ray CT, and nonuniform attenuation in emission CT also effect imaging performance, but are difficult to model. Resolution measures are also important in 2D and 3D microscopy [14].…”

Section: Discussionmentioning

confidence: 99%

Direct measurement of resolution in volumetric imaging systems

Reimann

Flynn

Hames

1994

Proceedings of 1994 IEEE Nuclear Science Symposium - NSS'94

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The resolution of 2D imaging systems is frequently described by experimental estimates of the point, line, or edge spread function. It is shown that a response function across the normal to a boundary between two homogeneous volumes can provide a measure of resolution. The set of surface boundary voxels is determined by applying a simple threshold. The normal distance of every voxel to the surface is computed and an accumulator bin is incremented by the voxel's gray level. This results in an aggregate surface response function, which is related to 3D point, line, and plane spread functions. This method can be applied to general boundary interfaces where precise surface normals are known, such as those on a sphere or plane. Results of applying this method to volumetric cone beam x-ray CT data are shown.

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Section: Discussionmentioning

confidence: 99%

Direct measurement of resolution in volumetric imaging systems

Reimann

Flynn

Hames

1994

Proceedings of 1994 IEEE Nuclear Science Symposium - NSS'94

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“…In order to describe objectively the gain in image quality for these new transmission imaging modes. we are applying digital image quality criteria (Kriete 1993). We have demonstrated.…”

Section: Confocal Transmissionmentioning

confidence: 99%

“…the charge neutralization on not too rough insulating surfaces and the increased secondary electron yield when decreasing the electron energy are the main reasons for the increasing interest in low-voltage SEM (LVSEM) with electron energies E = 0.1-5 keV (Joy 1985. Pawley 1984. 1993.…”

Section: Referencesmentioning

confidence: 99%

“…Therefore, we started to measure important quantities like the backscattering coefficient q, the secondary electron yield 6 and the electron range in dependence of the electron energy and the surface tilt angle, and the crossover energy E2 beyond which CJ = q + 6 becomes less than unity (Bongeler et a/. 1992. 1993, 1993.…”

Section: What We Shall Know About Electron-specimen Interactions In Lmentioning

confidence: 99%

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Proceedings of SCANNING ′93 Orlando, Florida, USA. part 1

1993

Scanning

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The personal computer revolution has forced a change in the basic functions of computers. Previously, a computer was an expensive resource that required a large staff and amount of time to operate. Today, the computer has become an inexpensive mass-market commodity similar to the television. The successful implementation of the graphical user interface has made it much easier for the casual computer user to employ the computer as a tool for the solution of research problems. This can be seen in the enormous amount of software that is available for the massmarket personal computer. Word processing, spreadsheet, data base, charting, equation-solving, and image-processing programs are a few examples of the software packages that are readily available and successfully utilized by the casual computer user. The power and ease of use of the standard mass market personal computer has made it not only commonplace in most laboratories, but necessary.Never before has the researcher been able to go from raw data to publication quality output in only a few hours with inexpensive, general purpose equipment.The success of this change has been the result of the mass-market appeal of the personal computer. There are several large markets that are driven by the personal computer. A good example of this market is desktop publishing. The desktop publishing market has created a demand for low-cost, high-capacity hard drives; large-area, highresolution, million color graphics displays; high-resolution gray and color CCD scanners; and photographic-quality color printers. In addition, several high-quality image processing software packages are commercially available. All of this equipment and software is available for immediate use by the scientific community as general purpose research tools. Whereas previously, the demands of the research market brought about new and innovative tools, it is now the mass market that will bring advanced computing tools to the research community.With the power, features, ease of use, and low cost of the mass-market computer, it is obvious that the sole function EDS system is becoming obsolete. Whereas historically, the equipment required for EDS was composed of dedicated custom hardware and software that was integrated with a sole-function computer system, the EDS system of tomorrow will be composed of a multifunctional massmarket computer platform. The future of EDS hardware is that of a peripheral, similar to a color scanner or video capture card. This hardware will take the form of smart, selfcontained peripherals that follow existing hardware interface standards (ethernet, SCSI, etc.) so that they can be easily connected to various computer platforms. When an EDS system is upgraded to take advantage of new and more powerful computers, it will be the computer itself that is replaced, not the entire EDS system. EDS software will follow existing standards of the graphical user interface; as a result, EDS software will be as easy to use as any other standard computer software package. The EDS user shou...

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“…A number of image quality descriptors have been developed in application that use autofocussing methods. These techniques rely on ad hoc definitions of image quality, for example, they aim at measuring features in the spatial domain such as sharpness or the variance of gray levels (Jarvis 1976, Kriete 1994. Focus descriptors which work within critical frequency bands (Boddeke et al 1994, Geusebroek et al 1999 have also been proposed.…”

Section: Introductionmentioning

confidence: 99%

Quality measures in applications of image restoration

Kriete¹,

Naim²,

Schäfer³

2001

Scanning

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Summary:We describe a new method for the estimation of image quality in image restoration applications. We demonstrate this technique on a simulated data set of fluorescent beads, in comparison with restoration by three different deconvolution methods. Both the number of iterations and a regularisation factor are varied to enforce changes in the resulting image quality. First, the data sets are directly compared by an accuracy measure. These values serve to validate the image quality descriptor, which is developed on the basis of optical information theory. This most general measure takes into account the spectral energies and the noise, weighted in a logarithmic fashion. It is demonstrated that this method is particularly helpful as a user-oriented method to control the output of iterative image restorations and to eliminate the guesswork in choosing a suitable number of iterations.

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Image Quality Considerations in Computerized 2-D and 3-D Microscopy

Cited by 7 publications

References 17 publications

Direct measurement of resolution in volumetric imaging systems

Direct measurement of resolution in volumetric imaging systems

Proceedings of SCANNING ′93 Orlando, Florida, USA. part 1

Quality measures in applications of image restoration

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