Image charge detection of ion bunches using a segmented, cryogenic detector

Räcke, Paul; Meijer, Jan; Spemann, D.

doi:10.1063/5.0096094

Cited by 4 publications

(2 citation statements)

References 18 publications

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“…Generally, from such signals, information on the particle kinetic energy, the length of a particle bunch and the contained charge can be derived 17 – 19 , 21 . If the individual particle charge is known, this allows for a counting of particles with close to single-particle sensitivity 18 , 21 . However, implementations of such a detector that use radially symmetric electrodes (e.g.…”

Section: Concept and Theorymentioning

confidence: 99%

“…This is true for example for rare species or when monitoring on a shot-to-shot basis is required. Such single-pass non-destructive detection and measurement is possible with regard to particle kinetic energy 16 – 18 and the total amount of charge per bunch 17 – 19 . Similar methods are also in use for dedicated measurements of particle mass 20 .…”

Section: Introductionmentioning

confidence: 99%

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Position-sensitive non-destructive detection of charged-particle bunches in low-energy beamlines

Ringleb,

Kiffer,

Ballentin

et al. 2023

Sci Rep

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We have developed and operated an electronic detection system for the non-destructive single-pass detection of bunches of charged particles in a beamline that allows for a measurement of their lateral position with respect to the central beamline axis on a shot-to-shot basis. It provides all features of our related development reported in Kiffer et al. (Rev Sci Instrum 90:113301, 2019), namely single-pass measurement of bunch length, kinetic energy and absolute charge, and is additionally designed to provide the lateral position of bunches with sub-mm accuracy. We show the setup, associated methods and provide characterizing measurements with bunches of highly charged ions in the keV regime of kinetic energy that demonstrate the capabilities and show a typical application.

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Section: Concept and Theorymentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Position-sensitive non-destructive detection of charged-particle bunches in low-energy beamlines

Ringleb,

Kiffer,

Ballentin

et al. 2023

Sci Rep

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show abstract

Graphene‐Enhanced Single Ion Detectors for Deterministic Near‐Surface Dopant Implantation in Diamond

Collins,

Jakob,

Robson

et al. 2023

Adv Funct Materials

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Diamond color centers with applications to single photon sources, quantum computation, and magnetic field sensing down to the nanoscale have been investigated using ensembles of near‐surface implanted atoms. Deterministic ion implantation for ions stopping between 30 and 130 nm deep is demonstrated by configuring an electronic‐grade diamond substrate with a biased surface graphene electrode connected to charge sensitive electronics. The thin graphene electrode has a negligible surface dead layer, so implantation events are signaled from the drift of electron–hole pairs induced by the dissipation of ion kinetic energy in the substrate. Ion beam induced charge maps from a scanned 1 MeV He microbeam show the graphene electrode is highly effective with a charge collection efficiency up to 86% compared to an O‐terminated diamond surface of 30%. For lower energy ions, applicable to near surface implantation, single ion detection confidence is >99(1)% for 19.5 keV H and 85(2)% for 24 keV N ions to allow maps of device surface features by employing a focused ion beam microscope or an atomic force microscope cantilever incorporating a nanostencil beam collimator. In the near‐term, this system can be used to investigate the annealing dynamics for the conversion of single implanted ions into diamond color centers.

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Roadmap for focused ion beam technologies

Höflich,

Hobler,

Allen

et al. 2023

Applied Physics Reviews

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The focused ion beam (FIB) is a powerful tool for fabrication, modification, and characterization of materials down to the nanoscale. Starting with the gallium FIB, which was originally intended for photomask repair in the semiconductor industry, there are now many different types of FIB that are commercially available. These instruments use a range of ion species and are applied broadly in materials science, physics, chemistry, biology, medicine, and even archaeology. The goal of this roadmap is to provide an overview of FIB instrumentation, theory, techniques, and applications. By viewing FIB developments through the lens of various research communities, we aim to identify future pathways for ion source and instrumentation development, as well as emerging applications and opportunities for improved understanding of the complex interplay of ion–solid interactions. We intend to provide a guide for all scientists in the field that identifies common research interest and will support future fruitful interactions connecting tool development, experiment, and theory. While a comprehensive overview of the field is sought, it is not possible to cover all research related to FIB technologies in detail. We give examples of specific projects within the broader context, referencing original works and previous review articles throughout.

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Image charge detection of ion bunches using a segmented, cryogenic detector

Cited by 4 publications

References 18 publications

Position-sensitive non-destructive detection of charged-particle bunches in low-energy beamlines

Position-sensitive non-destructive detection of charged-particle bunches in low-energy beamlines

Graphene‐Enhanced Single Ion Detectors for Deterministic Near‐Surface Dopant Implantation in Diamond

Roadmap for focused ion beam technologies

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