2021
DOI: 10.1002/anie.202108994
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Identifying Reactive Sites and Surface Traps in Chalcopyrite Photocathodes

Abstract: Gathering information on the atomic nature of reactive sites and trap states is key to fine tuning catalysis and suppressing deleterious surface voltage losses in photoelectrochemical technologies. Here, spectroelectrochemical and computational methods were combined to investigate a model photocathode from the promising chalcopyrite family: CuIn0.3Ga0.7S2. We found that voltage losses are linked to traps induced by surface Ga and In vacancies, whereas operando Raman spectroscopy revealed that catalysis occurre… Show more

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Cited by 11 publications
(19 citation statements)
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“…19 It is likely that these energy traps, induced by surface vacancies of In and Ga, are responsible for the FLP observed during the PEC CO 2 reduction. Finally, we can use the IMPS data to compare the relative magnitudes of the rate constants for the HER (in aqueous electrolyte 19 ) and the CO 2 -to-CO conversion. We note that although the rate constants obtained by IMPS are phenomenological, a qualitative comparison could be drawn given that the electrodes and experimental parameters are maintained and only the solvent and the reaction are altered.…”
mentioning
confidence: 99%
“…19 It is likely that these energy traps, induced by surface vacancies of In and Ga, are responsible for the FLP observed during the PEC CO 2 reduction. Finally, we can use the IMPS data to compare the relative magnitudes of the rate constants for the HER (in aqueous electrolyte 19 ) and the CO 2 -to-CO conversion. We note that although the rate constants obtained by IMPS are phenomenological, a qualitative comparison could be drawn given that the electrodes and experimental parameters are maintained and only the solvent and the reaction are altered.…”
mentioning
confidence: 99%
“…In both MV and NaPi electrolytes, E F,p becomes more oxidizing with increasing light intensity, as expected for a photocathode. On the other hand, E F,n stays constant and remains close to the energy of the surface states (likely gallium vacancies 16 ), approximately 0.5 eV above the valence band edge. This phenomenon is known as Fermi level pinning and has been documented for many semiconductor electrodes, 16,43,[52][53][54][55] incl.…”
Section: Resultsmentioning
confidence: 90%
“…On the other hand, E F,n stays constant and remains close to the energy of the surface states (likely gallium vacancies 16 ), approximately 0.5 eV above the valence band edge. This phenomenon is known as Fermi level pinning and has been documented for many semiconductor electrodes, 16,43,52–55 incl. chalcopyrites.…”
Section: Resultsmentioning
confidence: 90%
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“…Alternatively, as another powerful frequency dominant technology, IMPS is used to decouple the process of charge transfer and recombination at the electrode–electrolyte interface under modulated illumination . To date, it is rare to see the discussion about the surface states in semiconductors of IMPS research, although this is a bottleneck problem that restricts the PEC performance, and existing reports are limited to typical photoanode materials such as TiO 2 and BiVO 4 . , Considering that the existence of surface states in CBO photocathodes has been previously proven, a dynamic model including the surface-state capacitance is used to quantitatively describe the interface charge behavior. Figure panels a–c show the above-mentioned dynamic mechanism.…”
mentioning
confidence: 99%