2014
DOI: 10.1109/tdmr.2014.2348195
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Identifying PV Module Mismatch Faults by a Thermography-Based Temperature Distribution Analysis

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Cited by 137 publications
(67 citation statements)
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References 34 publications
(31 reference statements)
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“…Therefore, the authors consider a reasonable threshold of 5% to avoid high rates of false positives in order to identify not all but almost every significant defect in the PV plant. A similar approach is proposed by [32], [33] where the authors classify the severity of faults in three different degrees, namely minor, medium and heavy faults. In this last case part of a module is typically shorted by a bypass diode as an outcome of, for examples, mismatch, cell cracking, partial shading, and increased internal resistance [8].…”
Section: Experimental Analysis and Resultsmentioning
confidence: 99%
“…Therefore, the authors consider a reasonable threshold of 5% to avoid high rates of false positives in order to identify not all but almost every significant defect in the PV plant. A similar approach is proposed by [32], [33] where the authors classify the severity of faults in three different degrees, namely minor, medium and heavy faults. In this last case part of a module is typically shorted by a bypass diode as an outcome of, for examples, mismatch, cell cracking, partial shading, and increased internal resistance [8].…”
Section: Experimental Analysis and Resultsmentioning
confidence: 99%
“…Therefore, the position of the MPP voltage of the nth peak U mn is mainly determined by the nth PV module. Equation (13) shows that the MPP voltage of the nth PV module U mpn can be expressed as follows:…”
Section: Mpf For a Pv String Under Module-level Pscsmentioning
confidence: 99%
“…These heuristic methods perform extremely well under normal irradiance conditions. However, PV modules are generally installed in outdoor environments, and they are prone to electrical faults as a result of PSCs and hotspots [13]- [14]. It is common to experience PSCs due to dust, clouds or shadows.…”
Section: Introductionmentioning
confidence: 99%
“…Hot spots are relatively frequent in current PV modules and this situation will likely persist as the PV module technology is evolving to thinner wafers, which are prone to developing micro-cracks during the manipulation process such as manufacturing, transportation, and installation [6][7][8].…”
Section: Introductionmentioning
confidence: 99%