Identifying Defect Injection Risks from Analysis and Design Diagrams: An Industrial Case Study at Sony

Imanishi, Yoji; Kumon, Kazuhiro; Morisaki, Shuji

doi:10.1109/icse-seip58684.2023.00044

2023 IEEE/ACM 45th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP) 2023

DOI: 10.1109/icse-seip58684.2023.00044

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Identifying Defect Injection Risks from Analysis and Design Diagrams: An Industrial Case Study at Sony

Yoji Imanishi,

Kazuhiro Kumon,

Shuji Morisaki

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Identifying Defect Injection Risks from Analysis and Design Diagrams: An Industrial Case Study at Sony

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References 27 publications

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