Identification the Role of Grain Boundaries in Polycrystalline Photovoltaics via Advanced Atomic Force Microscope
Liu Yang,
Yanyan Wang,
Xu Wang
et al.
Abstract:Atomicforce microscopy (AFM)‐based scanning probing techniques, including Kelvinprobe force microscopy (KPFM) and conductive atomic force microscopy (C‐AFM), have been widely applied to investigate thelocal electromagnetic, physical, or molecular characteristics of functional materials on a microscopic scale. The microscopic inhomogeneities of the electronic properties of polycrystalline photovoltaic materials can be examined by these advanced AFM techniques, which bridge the local properties of materials to o… Show more
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