Identification of multiple crack locations in micro cantilever beam by wavelet transforms

Abstract

Background/Objectives: Presence of cracks in micro cantilever beams badly influence the performance of the device. This study is to propose suitable method utilizing wavelet transform to detect the cracks present over the structure of micro cantilever beams. Methods: The proposed device structure was designed and modeled using COMSOL Multi-physics simulation software. The signals obtained are analyzed using wavelet transform. Findings: Micro cantilevers shows difference in its vibrational frequency, stress and deflection over various input conditions. The location of the multiple cracks which appears in micro cantilever structure due to various working conditions were perfectly identified using wavelet transform analysis. Novelty/Applications: We report the accurate locations of the crack present in micro structured devices. This ideal method can be applied on micro cantilever devices which found its applications as Transducers, Sensors, Switches, Actuators and Probes.

Applications of Wavelet Transform and Wavelet Packet Transform to Detect the Crack in Micro Beams

“…By the use of such ridges and peaks in wavelet analysis, we could exactly locate the cracks and damages present in the micro device. Dynamic characteristics of the device will reflect with respect to the damage or cracks over the surface [9,10]. Here we had compared devices with various cracks present in the device surface.…”