The present investigation on heterosis and inbreeding depression in wheat was carried out at the Crop Research Farm of CSAUA&T, Nawabganj, Kanpur, U.P., India, during the Rabi crop season 2019-20. A ten parental half-diallel cross comprising of 45 F 1 s and 45 F 2 s together with parents was grown in three replications. The outcome of better parent heterosis revealed that the cross combinations, namely, HD3086 x HD-2733, HD3086 x K0307, HD3086 x HD2967, HD3086 x K1601, and HD2967 x K0402 exhibited positive and high heterosis for grain yield. In the case of economic heterosis over the check (HD2967), the cross combination viz. HD3086 x K0307, HD3086 x HD2967, HD-967 x K0402, HD2967 x K1601, and HD2967 x K1314 exhibited significant and positive heterosis for grain yield. Inbreeding depression for grain yield ranged from 1.51 (DH 29767 x K 8962) to 8.95 (DBW 88 x K 8962) percent. For grain yield, out of the 45 crosses, all combinations exhibited significant and positive inbreeding depression in F 2 . The cross combinations may be used to increase grain yield and to produce better transgressive segregants for future breeding programs to maintain the specific gene pool of bread wheat.