Fourtieth IAS Annual Meeting. Conference Record of the 2005 Industry Applications Conference, 2005.
DOI: 10.1109/ias.2005.1518856
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Identification of EMI noise sources through the use of fourier and wavelet transforms

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“…If the environment ambient noise is complex enough, discriminating EUT ¶s EMI signal from ambient noise will become extraordinary hard, and the veracity of test will be reduced [5,6].…”
Section: Introductionmentioning
confidence: 99%
“…If the environment ambient noise is complex enough, discriminating EUT ¶s EMI signal from ambient noise will become extraordinary hard, and the veracity of test will be reduced [5,6].…”
Section: Introductionmentioning
confidence: 99%