2022
DOI: 10.1016/j.scriptamat.2022.114648
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Identification of active slip systems in polycrystals by Slip Trace - Modified Lattice Rotation Analysis (ST-MLRA)

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Cited by 18 publications
(1 citation statement)
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“…There may be situations that the directions of multiple slip traces were close to that in the SEM image. In that case, Schmid factor (SF) was taken as the criterion for the selection of the active slip mode, i.e., the one with largest SF value was taken as the active slip system [34,35]. Similarly, since the three slip systems of basal slips were located in the same plane, the one with the highest SF was chosen as the active slip system.…”
Section: Slip Activity During In-situ Tensionmentioning
confidence: 99%
“…There may be situations that the directions of multiple slip traces were close to that in the SEM image. In that case, Schmid factor (SF) was taken as the criterion for the selection of the active slip mode, i.e., the one with largest SF value was taken as the active slip system [34,35]. Similarly, since the three slip systems of basal slips were located in the same plane, the one with the highest SF was chosen as the active slip system.…”
Section: Slip Activity During In-situ Tensionmentioning
confidence: 99%