Identification and localization of molecular markers linked to the<i>Lr52</i>leaf rust resistance gene of wheat

Tar, M.; Purnhauser, L.; Csósz, M.

doi:10.1556/crc.36.2008.3.5

Cited by 11 publications

(8 citation statements)

References 13 publications

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“…SCAR markers are advantageous over RAPD markers because these are codominant, detect only single genetically defined loci, identified as distinct bands in agarose gels, are easier to score, less sensitive to reaction conditions and are more reproducible. SCARs linked to disease resistance genes have been identified in many crops like wheat (Gold et al, 1999;Tar et al, 2002), soybean (Zheng et al, 2003), tomato (Ohmori et al, 1996;Sobir et al, 2000), sorghum (Boora et al, 1998). In view of these, based on the sequences of RAPD marker OPJ 01 1437, a pair of SCARs was generated (Table 2).…”

Section: Discussionmentioning

confidence: 99%

Identification and characterization of RAPD and SCAR markers linked to anthracnose resistance gene in sorghum [Sorghum bicolor (L.) Moench]

et al. 2006

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Section: Discussionmentioning

confidence: 99%

Identification and characterization of RAPD and SCAR markers linked to anthracnose resistance gene in sorghum [Sorghum bicolor (L.) Moench]

et al. 2006

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“…A large number of earlier studies showed that the bulked segregant analysis has been successfully used to find RAPD markers linked to various disease resistant genes, especially rust resistance in common bean (Park et al 2004), angular leaf spot in common bean (Nietsche et al 2000) downy mildew disease in soybean (Chowdhury et al 2002), leaf rust resistance in wheat. (Tar et al 2002) and virus resistant genes mungbean yellow mosaic virus (MYMV) resistant gene in mungbean (Selvi et al 2006), hence RAPD markers were used for tagging MYMV resistant gene.…”

Section: Resultsmentioning

confidence: 99%

Screening and identification of random amplified polymorphic DNA (RAPD) markers linked to mungbean yellow mosaic virus (MYMV) resistance in mungbean (Vigna radiata(L.) Wilczek)

Karthikeyan

Manickam

Pandiyan

et al. 2012

Archives Of Phytopathology And Plant Protection

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Bulk segregant analysis (BSA) and random amplified polymorphic DNA (RAPD) techniques were used to analyse the F2 individuals of susceptible VBN (Gg) 2 6 resistant KMG 189 to screen and identify the molecular marker linked to mungbean yellow mosaic virus (MYMV) resistant gene in mungbean. Two DNA bulks namely resistant bulks and susceptible bulks were setup by pooling equal amount of DNA from five randomly selected plants of each disease response. A total of 72 random sequence decamer oligonucleotide primers were used for RAPD analysis. Primer OPBB 05 (5 0 -GGGCCGAACA-3 0 ) generated OPBB 05 260 fragment in resistant parent and their bulks but not in the susceptible parent and their bulks. Co segregation analysis was performed in resistant and susceptible F2 individuals, it confirmed that OPBB 05 260 marker was tightly linked to mungbean yellow mosaic virus resistant gene in mungbean.

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“…Various molecular markers, including STS, SSR and SCAR markers, closely linked to specific Lr genes were derived from previous researches. Molecular markers of Lr1 [27], Lr9 [28,29], Lr10 [30], Lr19 [31], Lr20 [32], Lr21 [14], Lr24 [33,34], Lr26 [16], Lr28 [35,36], Lr29 [37], Lr32 [38], Lr34 [17,18], Lr35 [39], Lr37 [40], Lr38 [41] and Lr47 [8] were used in this study to screen all the collected 35 wheat cultivars. The sequences of all primers are provided in Supplementary Table S2.…”

Section: Molecular Markers-assisted Identification Of Lr Genesmentioning

confidence: 99%

Leaf Rust Resistance of 35 Wheat Cultivars (Lines)

Li¹,

Shi²,

Wang³

et al. 2018

J Plant Pathol Microbiol

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Wheat leaf rust caused by Puccinia triticina (Pt) is one of most severe fungal diseases threatening global wheat production. Rational utilization of the diversified leaf rust resistance (Lr) in different wheat cultivars is still the most efficient method to control this disease. Here in this study, 35 wheat cultivars collected from China main wheat growth region were tested for their seedling resistance to 16 different Pt races. Seedlings of 20 tested wheat cultivars showed high resistance phenotype to at least one Pt race. Various molecular markers closely linked to fifteen designated Lr genes were applied and only three Lr genes (Lr1, Lr10 and Lr26) were identified in some of the tested cultivars. All cultivars were then inoculated with bulked Pt races mixed with even of 10 pathotypes at adult plant stage to detect the adult plant resistance (APR). Five cultivars including Liangxing 66, Hemai 9735, Luyuan 301, Jimai 17 and Taishan 027 showed typical APR reaction in the field. Our results indicate that the diversity of known Lr genes in the tested wheat cultivars is relative low, but 10 of them contained more durable leaf rust resistance and can be released in wheat production and can be used as resistance breeding resources.

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Identification and localization of molecular markers linked to theLr52leaf rust resistance gene of wheat

Cited by 11 publications

References 13 publications

Identification and characterization of RAPD and SCAR markers linked to anthracnose resistance gene in sorghum [Sorghum bicolor (L.) Moench]

Identification and characterization of RAPD and SCAR markers linked to anthracnose resistance gene in sorghum [Sorghum bicolor (L.) Moench]

Screening and identification of random amplified polymorphic DNA (RAPD) markers linked to mungbean yellow mosaic virus (MYMV) resistance in mungbean (Vigna radiata(L.) Wilczek)

Leaf Rust Resistance of 35 Wheat Cultivars (Lines)

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