2009
DOI: 10.1016/j.nima.2008.11.137
|View full text |Cite
|
Sign up to set email alerts
|

IBARAKI materials design diffractometer (iMATERIA)—Versatile neutron diffractometer at J-PARC

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
71
0

Year Published

2011
2011
2022
2022

Publication Types

Select...
7
1

Relationship

2
6

Authors

Journals

citations
Cited by 141 publications
(77 citation statements)
references
References 7 publications
0
71
0
Order By: Relevance
“…Since the slit size of the incident beam was 20 mm × 20 mm, the sample volume was fully irradiated in the diffraction experiment. The neutron diffraction measurement was conducted at iMATERIA, 20th beamline at J-PARC MLF [5]. The texture and phase fractions were analyzed by applying the Rietveld texture analysis The neutron diffraction measurement was conducted at iMATERIA, 20th beamline at J-PARC MLF [5].…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…Since the slit size of the incident beam was 20 mm × 20 mm, the sample volume was fully irradiated in the diffraction experiment. The neutron diffraction measurement was conducted at iMATERIA, 20th beamline at J-PARC MLF [5]. The texture and phase fractions were analyzed by applying the Rietveld texture analysis The neutron diffraction measurement was conducted at iMATERIA, 20th beamline at J-PARC MLF [5].…”
Section: Methodsmentioning
confidence: 99%
“…The neutron diffraction measurement was conducted at iMATERIA, 20th beamline at J-PARC MLF [5]. The texture and phase fractions were analyzed by applying the Rietveld texture analysis The neutron diffraction measurement was conducted at iMATERIA, 20th beamline at J-PARC MLF [5]. The texture and phase fractions were analyzed by applying the Rietveld texture analysis (RTA) by using Materials Analysis Using Diffraction (MAUD) software [8].…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Neutron diffraction measurements were performed at 295 K with IBARAKI Materials Design Diffractometer (iMATERIA) installed at the Materials and Life Science Experimental Facility (MLF) in J-PARC [15]. The diffraction intensities were collected by time of flight (TOF) method.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…The exposure time for data collection in the 0.12-MW operation was approximately 900 s for each sample contained in a 6-mm diameter cylindrical vanadium cell. A more detailed description of the diffractometer can be found elsewhere [11]. Rietveld refinements were performed using the program Z-Rietveld ver.…”
Section: Methodsmentioning
confidence: 99%