I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment

Abstract

An I DDQ test method is proposed in this paper, which is applicable even if supply current measurement is impaired by noise. Wavelet transformation is used for noise elimination in the test method. In this paper, it is shown by some experiments that bridging faults will be detected by using the proposed test method. Since expert knowledge on filter design is not needed in noise elimination of the I DDQ test method, it is expected that the test method will be used in many I DDQ tests.

Selecting input current waveforms using a hardware testing implementation incorporated in FPGAs

“…Among others, the root-mean-square (RMS) value of the supply current and the magnitude and phase components of its spectrum (Fourier transform) have been used [11]. Another approach is based on the use of the wavelet transform, which resolves a signal in both time and frequency simultaneously [12][13][14]. It gives a better approximation of a transient current waveform than the Fourier transform for a certain frequency of the signal.…”

Input stimulus comparison using an adaptive FPGA-based testing system

“…Another approach is based on the use of the wavelet transform, which resolves a signal in both time and frequency simultaneously [10][11][12]. It gives a better approximation of a transient current waveform than the Fourier transform for a certain frequency of the signal.…”