ϕ(ρz) Distributions in Bulk and Thin Film Samples for EPMA. Part 1: A Modified ϕ(ρz) Distribution for Bulk Materials, Including Characteristic and Bremsstrahlung Fluorescence

Moy, Aurélien; Fournelle, John

doi:10.1017/s1431927620024915

Cited by 10 publications

(9 citation statements)

References 29 publications

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“…37 An alternative open source program entitled BadgerFilm has recently been released. 38,39 National Institute of Standards and Technology's Standard Reference Material (SRM) 481 served as both primary and secondary calibration standards. SRM 481 is comprised of a suite of AuAg alloy wires in 20 mass % compositional increments, as well as pure Au and Ag microanalysis standards (Table S1).…”

Section: ■ Experimental Sectionmentioning

confidence: 99%

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Nondestructive Microanalysis of Thin-Film Coatings on Historic Metal Threads

2021

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A new standards-based scanning electron microscopy with the energy-dispersive X-ray spectrometry (SEM−EDS) quantification method was used to analyze the thin-film coating of an 18th century French textile decorated with metal threads in variable pressure conditions. This analytical technique can allow for nondestructive quantitative characterization of the near surface of cultural heritage objects small enough to be placed in an SEM chamber that may contain corrosion products, without applying a conductive coating. A multivoltage analysis consisting of measurements taken at a series of electron beam energies was obtained and input into a film thickness and composition (FTC) computational model to characterize a layered Au on Ag reference material, in addition to a historic metal thread. Using the FTC computation, the thread coating was determined to be an alloy ≈ 80% Au 20% Ag on a nominally pure Ag substrate, and this composition matches a minimum gold standard allowed for goods around the time of manufacture. The computed gilding thicknesses range from single digit nm to 300 nm depending upon surface inhomogeneities formed during the production of the thread. Interaction volumes and X-ray spectra generated by Monte Carlo modeling are consistent with the measured gilding thicknesses and compositions. Validation of the FTC-computed gilding composition and thickness variations were obtained by cross-sectional analysis.

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Section: ■ Experimental Sectionmentioning

confidence: 99%

“…The FTC calculations were performed using STRATAGem v4.4 software, where the elemental composition and thickness of the surface coating were free parameters and empirically calculated . An alternative open source program entitled BadgerFilm has recently been released. , …”

Section: Experimental Sectionmentioning

confidence: 99%

Nondestructive Microanalysis of Thin-Film Coatings on Historic Metal Threads

2021

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“…However, their implementation into actual computer programs that can be used by EPMA labs is scarce and their availability is limited, either because of compatibility problems with modern computers or because of the cost of the license to acquire the program. In an intent to give more access to thin film analysis tools to EPMA labs, we have developed BadgerFilm, a free and open-source thin film analysis software [3,4]. The main purpose of BadgerFilm is to determine the compositions and thicknesses of thin film specimens by EPMA.…”

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confidence: 99%

“…However, the capabilities of the program go beyond the characterization of multilayers specimens. BadgerFilm can be used to accurately quantify bulk samples [3]. During the analysis of geological materials, oxygen is sometimes difficult to quantifybecause of interferences (especially with EDS detectors), because of the difficulty of having an accurate, stable, O standard, or to reduce the analysis timeand is determined by stoichiometry relative to the other elements.…”

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confidence: 99%

BadgerFilm: a versatile thin film analysis program for EPMA and more

Moy

Fournelle

2021

Microsc Microanal

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“…Elemental composition and thickness of multi-layered samples was calculated using the BadgerFilm thin film analysis program [5,6]. BadgerFilm calculates theoretical k-ratios with the PAP phi-rho-z algorithm [7] and modified phi-rho-z matrix correction to calculate characteristic and Bremsstrahlung fluorescence effects.…”

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confidence: 99%

Oxidation of metallic glass thin films: a combined EPMA and XPS investigation into the composition and thickness of oxidized surfaces

et al. 2021

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Metallic glass thin films (MGTFs) are a recently developed alternative to conventional alloy thin films that exhibit several unique material properties beneficial in applications from biomedical devices to electrical components [1,2]. The surface of MGTFs is characterized by ultra low coefficient of friction, and combined with Zr-based MGTFs' biocompatibility, makes them an advantageous coating material for minimally-invasive surgical devices and syringes [3]. Minimizing surface oxidation is critical to longterm utility of Zr-based MGTFs in biomedical applications and needs to be well understood for design considerations. We combined thin film analysis by electron probe microanalysis (EPMA) with X-ray photoelectron spectroscopy (XPS) to quantify the composition and thickness of surface oxidation layers of Zr-based MGTFs.

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ϕ(ρz) Distributions in Bulk and Thin Film Samples for EPMA. Part 1: A Modified ϕ(ρz) Distribution for Bulk Materials, Including Characteristic and Bremsstrahlung Fluorescence

Abstract: Abstract

Cited by 10 publications

References 29 publications

Nondestructive Microanalysis of Thin-Film Coatings on Historic Metal Threads

Nondestructive Microanalysis of Thin-Film Coatings on Historic Metal Threads

BadgerFilm: a versatile thin film analysis program for EPMA and more

Oxidation of metallic glass thin films: a combined EPMA and XPS investigation into the composition and thickness of oxidized surfaces

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