<i>XtalCAMP</i>: a comprehensive program for the analysis and visualization of scanning Laue X-ray micro-/nanodiffraction data

Li, Yao; Chen, Kai; Dang, Xiaofeng; Zhang, Fengying; Tamura, Nobumichi; Ku, Ching−Shun; Kang, Huijun; Wenk, Hans‐Rudolf

doi:10.1107/s1600576720010882

Cited by 10 publications

(6 citation statements)

References 38 publications

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“…The output from XMAS, a sequential list file which contains the crystal orientations and strain tensor for every diffraction image indexed, is then loaded into the MATLAB code Xtal-CAMP (Li et al, 2020). The orientation and magnitude of the principal strain axes are calculated for each diffraction image using an eigen decomposition of the deviatoric strain tensor.…”

Section: How Deviatoric Strain Is Measured and Principal Stress Calcu...mentioning

confidence: 99%

“…X-ray Laue microdiffraction measurements were conducted at beamline 12.3.2 of the Advanced Light Source (ALS) at Lawrence Berkeley National Laboratory. The methodology has been previously described (Tamura, 2014;Chen et al, 2016;Li et al, 2020;Wenk et al, 2020). The 1.8 Â 1.4 Â 0.12 mm Ti sample was loaded onto a translational stage.…”

Section: X-ray Laue Microdiffractionmentioning

confidence: 99%

“…For the past 10 years, we have analyzed the orientation of macrostresses responsible for residual strain in natural quartzite using mXRD and have found results consistent with the stress history presumed from geological events. We developed a methodology to represent the 3D orientation of residual strain axes with pole figures generally used for crystal orientations or textures (Chen et al, 2011(Chen et al, , 2016Li et al, 2020;Wenk et al, 2020). However, geological materials have a complex stress history, enduring a variety of stresses over long time scales, and thus there remains some uncertainty about their presumed stress history.…”

Section: Introductionmentioning

confidence: 99%

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Residual strain orientation in rolled titanium determined with synchrotron X-ray Laue microdiffraction

Devoe¹,

Tamura²,

Wenk³

2023

J Appl Cryst

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Previously, synchrotron X-ray Laue microdiffraction has been used to measure the magnitudes of residual strain in materials. Recently the method was advanced to determine the orientation of the strain ellipsoid and applied to naturally deformed quartzites; however, the deformation history of these quartzites is ambiguous due to their natural origin. In this study, synchrotron X-ray Laue microdiffraction (µXRD) is used to measure the residual strain for the first time in a sample with known stress history, rolled titanium. A deviatoric strain tensor is calculated from each Laue diffraction image collected with two µXRD scans of a rolled titanium sheet in different sample orientations. The principal strain axes are calculated using an eigen decomposition of the deviatoric strain tensors. The results show that the principal axis of compression is aligned with the normal direction of the titanium sheet, and the principal axis of extension is aligned with the rolling direction. Pole figures are used to represent the 3D distribution of residual strain axes.

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Section: How Deviatoric Strain Is Measured and Principal Stress Calcu...mentioning

confidence: 99%

Section: X-ray Laue Microdiffractionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Residual strain orientation in rolled titanium determined with synchrotron X-ray Laue microdiffraction

Devoe¹,

Tamura²,

Wenk³

2023

J Appl Cryst

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“…To demonstrate this function, the data obtained from a Ni-based superalloy will be considered as an example case. The output of results analyzed by PYXIS can be input into our previously developed software package XtalCAMP (Li et al, 2020) for further analyses and better visualization.…”

Section: Introductionmentioning

confidence: 99%

PYXIS: an integrated software package for synchrotron micro/nanodiffraction data analysis

Kou,

Chen

2024

J Appl Crystallogr

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PYXIS, a software package based on the MATLAB platform, is suitable for the in-depth analysis of synchrotron X-ray Laue micro/nanodiffraction and energy scan data. The main objective of the software is to analyze the following three aspects of the data. First, in a single Laue diffraction pattern, it can remove the background, search and index the peaks, and obtain the crystal orientation and the elastic strain tensor. A novel zone-axis assisted indexing algorithm has been developed to speed up this process. Second, a batch of Laue patterns obtained from a scan can be analyzed simultaneously to map the orientation and strain distributions, which is achieved efficiently by applying a peak position comparison strategy. An analysis of a Laue microdiffraction scan of the cross section of Li7La3Zr2O12 solid-state electrolyte has been taken as an example in this article to illustrate these functions. The third unique function in PYXIS involves data mining of energy scans. Considering a Ni-based superalloy as an example, the energy scan data sets are processed to reconstruct the diffraction peaks in three dimensions, allowing extraction of the lattice constants, lattice misfit and dislocation characteristics from the peak profiles.

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“…The collected Laue patterns are analyzed using in-house software packages PPCIA (software copyright registration number ARTICLES SCIENCE CHINA Materials 2018SR865737) and LDat (software copyright registration number 2018SR865716). Orientation, lattice strain, and peak width maps are plotted using XtalCAMP developed at Xi'an Jiaotong University [23]. The future development prospect is also discussed briefly.…”

Section: Introductionmentioning

confidence: 99%

Development of micro-Laue technique at Shanghai Synchrotron Radiation Facility for materials sciences

Ren

Kou

et al. 2021

Sci. China Mater.

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Synchrotron radiation-based micro-Laue technique has showcased great application potentials in materials science study for its unprecedented crystal orientation and lattice strain/stress resolution. Here we report the updated progress in the development of the micro-Laue technique on the X-ray test beamline at Shanghai Synchrotron Radiation Facility. So far, 40 µm (h) × 50 µm (v) X-ray beam spot is routinely obtained, with the convergent angle of 0.2 mrad (h) × 0.12 mrad (v). Area scans are conducted on a GH3535 Nibased superalloy base metal and weld joint with the same chemical composition. By analyzing the tremendous amount of Laue diffraction patterns using in-house developed software packages, the crystal orientation, elastic strain, and defect distributions are mapped and investigated. Such a successful proof-of-principle study offers first-hand experience on the further optimization of the design and construction of the scanning micro-Laue facility on the superbend beamline with improved spatial resolution and multiple functions for simultaneous chemical fluorescence mapping and in-situ microstructural evolution studies. The micro-Laue diffraction beamline at Shanghai Synchrotron Radiation Facility will provide a versatile and powerful tool for the orientation and strain/stress mapping combined with phase identification with micron-sized spatial resolution.

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XtalCAMP: a comprehensive program for the analysis and visualization of scanning Laue X-ray micro-/nanodiffraction data

Cited by 10 publications

References 38 publications

Residual strain orientation in rolled titanium determined with synchrotron X-ray Laue microdiffraction

Residual strain orientation in rolled titanium determined with synchrotron X-ray Laue microdiffraction

PYXIS: an integrated software package for synchrotron micro/nanodiffraction data analysis

Development of micro-Laue technique at Shanghai Synchrotron Radiation Facility for materials sciences

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