2011
DOI: 10.1107/s0108767311079748
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PDXLstructure analysis wizard

Abstract: The reflection overlap problem is the primary limitation in structure determination from powder diffraction data, and over the last decade, a procedure that addresses this problem experimentally by exploiting preferred orientation has been developed [1]. The intensity variation in the X-ray diffraction pattern obtained from a textured sample as a function of sample orientation (tilt χ and rotation ϕ) can be applied to resolve the relative intensities of reflections that overlap in a conventional powder diffrac… Show more

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Cited by 2 publications
(2 citation statements)
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“…The sample was studied in the temperature range 30-250 • C with 10 • C steps (Figure S1). The room-temperature data were loaded into PDXL [21] to check the phase composition. The TOPAS software package [22] was used for the refinement of unit-cell parameters at all temperatures using the Pawley method.…”
Section: High-temperature Powder X-ray Diffractionmentioning
confidence: 99%
“…The sample was studied in the temperature range 30-250 • C with 10 • C steps (Figure S1). The room-temperature data were loaded into PDXL [21] to check the phase composition. The TOPAS software package [22] was used for the refinement of unit-cell parameters at all temperatures using the Pawley method.…”
Section: High-temperature Powder X-ray Diffractionmentioning
confidence: 99%
“…A thin powder sample was deposited on a Pt sample holder (20 × 12 × 2 mm 3 ) from an ethanol suspension. The data concerning room temperature were loaded into PDXL [18] to refine the phase composition, then the TOPAS software package [19] was used for refining the unit cell parameters for all temperatures via the Rietveld method (Table S1). The coordinates of atoms, site scattering, and isotropic displacement parameters were fixed.…”
Section: High-temperature Powder X-ray Diffractionmentioning
confidence: 99%