1995
DOI: 10.1063/1.113829
|View full text |Cite
|
Sign up to set email alerts
|

p-type conduction in Mg-doped Ga0.91In0.09N grown by metalorganic vapor-phase epitaxy

Abstract: p-type conduction in InN-containing nitrides doped with Mg has been achieved by metalorganic vapor-phase epitaxy. The hole concentration at room temperature is as high as 7×1017 cm−3. The activation energy of a Mg acceptor is estimated to be 204 meV. D–A pair emission with peak wavelength of about 405 nm is enhanced by thermal annealing.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

3
28
0
1

Year Published

1996
1996
2011
2011

Publication Types

Select...
4
4

Relationship

0
8

Authors

Journals

citations
Cited by 87 publications
(33 citation statements)
references
References 0 publications
3
28
0
1
Order By: Relevance
“…5. We achieved p-type AlGaN in 1991 [25] and ptype GaInN in 1995 [26] in the same manner. In 1992, ptype GaN was also produced by thermal annealing of Mgdoped GaN grown with the LT-GaN buffer layer by Nakamura et al [27].…”
Section: Discovery Of P-type Conduction In Gan and Realization Of Gansupporting
confidence: 49%
“…5. We achieved p-type AlGaN in 1991 [25] and ptype GaInN in 1995 [26] in the same manner. In 1992, ptype GaN was also produced by thermal annealing of Mgdoped GaN grown with the LT-GaN buffer layer by Nakamura et al [27].…”
Section: Discovery Of P-type Conduction In Gan and Realization Of Gansupporting
confidence: 49%
“…It is interesting to note that, although the green luminescence can be regarded as the redshift of the blue luminescence in GaN:Mg upon indium alloying (both bands were attributed to DAP transition between V N donors and Mg Ga acceptors), 6,9,17 the LO phonon-related fine structure is not observed in GaN:Mg. 17 As discussed in the Background section, the strength of phonon replicas is related to the degree of carrier localization. Consequently, the observation of sharp phonon replicas in InGaN:Mg, not observed in GaN:Mg, indicates much stronger carrier localization in InGaN:Mg than in GaN:Mg.…”
Section: Analysis Of the Shape Of Deep Level Luminescence In Ingan:mgmentioning
confidence: 96%
“…5 To form p-type material, Mg is used as a dopant. 3,[6][7][8] However, little is known about the defect complexes in Mg-doped InGaN. 6,8,9 Previously, donoracceptor pair (DAP) formation has been observed in InGaN:Mg by photoluminescence (PL) spectroscopy: 6 a broad emission band is observed at 2.48 eV for In 0.09 Ga 0.91 N:Mg.…”
Section: Introductionmentioning
confidence: 98%
See 1 more Smart Citation
“…In nonpolar a-plane Mg-doped GaN, the activation energy of Mg acceptors with an Mg concentration of 4.0 Â 10 19 cm À3 was found to be 118 meV [8], which is lower than that of c-plane GaN having the same Mg concentration. High hole concentration p-type Ga 1Àx In x N is necessary for the realization of high-performance green emitters, particularly green LDs [9][10][11]. A hole concentration of as high as 7.8 Â 10 18 cm À3 with an InN molar fraction of 0.20 was successively achieved in c-plane GaInN [9].…”
Section: Introductionmentioning
confidence: 99%