<i>Optical Properties of Thin Solid Films</i>

Heavens, O.S.; Wuensch, S.

doi:10.1063/1.3059910

Cited by 324 publications

(120 citation statements)

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“…The amplitude of the reflected beam is a result of interference between all the optical paths and is determined by the wavelength of the incident light ( ), their incident angles ( ), refractive indices of all layers (n), and their thicknesses (h). Thus, the total reflectivity of light from the triple-layer system can be described by 16 …”

Section: Resultsmentioning

confidence: 99%

Total Color Difference for Rapid and Accurate Identification of Graphene

et al. 2008

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For rapid and accurate identification of graphenes by optical images, a total color difference (TCD) method is proposed and demonstrated based on a combination of reflection spectrum and International Commission on Illumination color space. The preferential thickness of different dielectric films covered on a Si substrate is well elucidated, and a 72 nm thick Al2O3 film is found to be much better than the commonly used SiO2 or Si3N4 films. The TCD both between monolayer graphene and substrate and between graphene of different layers can be further improved by appropriately narrowing the wavelength range of the light source. Moreover, the influences of the objective lens in a real-world optical system on the TCD are also discussed. These findings provide useful information for rapid evaluation of the layer range of graphenes simply by different color bands and for accurate and reliable layer identification due to large TCD values, which opens up the possibility for the nondestructive identification and physical property measurements of graphene with an optical microscope.

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Section: Resultsmentioning

confidence: 99%

Total Color Difference for Rapid and Accurate Identification of Graphene

et al. 2008

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“…The oxide is transparent in the visible spectrum and so most of the re¯ection of incident light comes from the metal surface. Since the di erence in index of refraction of the metal±gas interface is higher than that of the metal±oxide interface [3], the metal surface under debonded oxide appears brighter than the same surface in contact with the oxide. An additional observation made was that the debonded regions of the scale form during cooling within a few minutes after removing a specimen from the furnace.…”

Section: Observations Of Scale Separationmentioning

confidence: 99%

Wrinkling of α-alumina films grown by oxidation—II. Oxide separation and failure

Tolpygo

Clarke²

1998

Acta Materialia

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“…This maximum is reached at h ∼ λ/n eff , where n eff is the effective refractive index of the film. In this maximum, an analytical solution of the Maxwell equations yields the following expression for the reflectance 44 ,…”

Section: A Enhancement Of Reflection Of the Optical Pulsementioning

confidence: 99%

Theory of dielectric nanofilms in strong ultrafast optical fields

Apalkov

Stockman

2012

Phys. Rev. B

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We theoretically predict that a dielectric nanofilm subjected to a normally-incident strong but ultrashort (a few optical oscillations) laser pulse exhibits deeply nonlinear (non-perturbative) optical responses which are essentially reversible and driven by the instantaneous optical field. Among them is a high optical polarization and a significant population of the conduction band, which develop at the peak of the pulse and almost disappear after its end. There is also a correspondingly large increase of the pulse reflectivity. These phenomena are related to Wannier-Stark localization and anticrossings between the Wannier-Stark ladders originating from the valence and conduction bands leading to optical "softening" of the dielectric. Theory is developed by solving self-consistently the Maxwell equations and the time-dependent Schrödinger equation. The results point out to a fundamental possibility of optical-field effect devices with the bandwidth on the order of optical frequency.

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Optical Properties of Thin Solid Films

Cited by 324 publications

References 0 publications

Total Color Difference for Rapid and Accurate Identification of Graphene

Total Color Difference for Rapid and Accurate Identification of Graphene

Wrinkling of α-alumina films grown by oxidation—II. Oxide separation and failure

Theory of dielectric nanofilms in strong ultrafast optical fields

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