input4MAUD: an efficient program for automatic two-dimensional diffraction image series input and/or batch refinement withMAUD

Abstract

In materials science or applied crystallography, X‐ray diffraction represents a versatile and useful method with which one can obtain the orientation of single crystals or even the texture of a polycrystalline material. When the investigated sample consists of many phases, or phases of low symmetry, it becomes difficult to measure pole figures from single diffraction peaks. A combined Rietveld–texture analysis with the program MAUD is perfectly suitable to deal with conditions of overlapping diffraction peaks, including those arising from different phases. Even though nearly no alternative to MAUD exists, it is not always easy to use. The input of a file series of two‐dimensional diffraction images, for example from a texture measurement, can be time consuming since each individual image must be loaded manually, and only the newest beta version of MAUD allows semi‐automated file input. The new program input4MAUD, which is presented in this paper, offers a much more efficient way to automate both single and batch file series input into MAUD as well as the preparation of basic batch refinements with MAUD. input4MAUD is written in Visual C++ and is currently available as a 32‐bit statically compiled binary executable file for Windows.

In-situ characterization of continuous dynamic recrystallization during hot torsion of an Al–Si–Mg alloy

“…Fig. 2 The collected 2D-images were integrated in sectors as a function of the azimuthal angle using the Input4MAUD software [21] and exported into MAUD software [22] for Rietveld analysis Eq. 5The crystallite size after heating at 400°C and before deformation is around 3500 Å, decreasing to  1500 Å up to εeff  0.25 (same order of magnitude that in [25]) due to the formation of cells and subgrains in the early stages, while the dislocation density ρ increases from  4x10 12 m -2 to  4x10 13 m -2 (Fig.…”

An In Situ Synchrotron Dilatometry and Atomistic Study of Martensite and Carbide Formation during Partitioning and Tempering

“…Different acquisition times were used to record the 2D images: Figure 2 a 1s from A (beginning of the transformation) up to the austenitization temperature (A ), during subsequent cooling from A up to the beginning of the tempering (T ), and during the final cooling down; Figure 2 b 5 s during the initial heating, and both holding temperatures A and T . The collected 2D images were integrated into sectors using the Input4MAUD software (Version 2.8, University of Göttingen, Germany) [ 33 ] and Rietveld refinements were performed with MAUD software (Version 2.55, University of Trento, Italy) [ 34 ]. Goodness of the refinements was assessed with the weighted R and R (no background) factors, which typically ranged from 10% to 20%.…”

Peculiar magnetism in Eu substituted BiFeO3and its correlation with local structure

“…X-ray diffraction (XRD) patterns of pure and Bi 1−x Eu x FeO 3 , where (0.05 ⩽ x ⩽ 0.8) compositions are presented in figure 1. In order to quantify lattice parameters, phase evolution, relative phase percentages, bond lengths, bond angles, residual strain induced by substituent etc, reitveld refinement was carried out using MAUD program [59]. After performing refinement, structure was visualized using the VESTA (Visualization for Electronic and Structural Analysis) software [60].…”