2008
DOI: 10.1142/s1793617908000264
|View full text |Cite
|
Sign up to set email alerts
|

IN SITU XPS STUDY OF Pd NANOPARTICLE FABRICATED BY GAS EVAPORATION METHOD

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2009
2009
2013
2013

Publication Types

Select...
2

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(3 citation statements)
references
References 15 publications
0
3
0
Order By: Relevance
“…The particle size can be evaluated by the height value of the AFM analysis. Because the height value of the AFM has a good resolution in comparison with the horizontal value [4,10]. As a result of AFM observation, it is found that Pd NPs have the average diameter of 2.6 nm with the standard deviation of 1.1 nm.…”
Section: Results and Disscussionsmentioning
confidence: 97%
See 2 more Smart Citations
“…The particle size can be evaluated by the height value of the AFM analysis. Because the height value of the AFM has a good resolution in comparison with the horizontal value [4,10]. As a result of AFM observation, it is found that Pd NPs have the average diameter of 2.6 nm with the standard deviation of 1.1 nm.…”
Section: Results and Disscussionsmentioning
confidence: 97%
“…It has been reported that Pd NPs surface is easily oxidized than that of bulk Pd by atmospheric components [10,11]. Therefore, we needed to connect the nanoparticle fabrication chamber of the gas evaporation method to the XPS measurement chamber.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation