<i>In situ</i>observation of the ferroelectric-paraelectric phase transition in a triglycine sulfate single crystal by variable-temperature electrostatic force microscopy

Luo, E.Z.; Xie, Zhongqiu; Xu, Jianbin; Wilson, I.; Zhao, Lihua

doi:10.1103/physrevb.61.203

Cited by 62 publications

(59 citation statements)

References 16 publications

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“…25 Contrast formation mechanism in PFM is less understood. 26 -30 Luo et al 17 have found that the temperature dependence of piezoresponse contrast is similar to that of spontaneous polarization. This behavior was attributed to the dominance of electrostatic interactions due to the presence of a polarization bound charge, 31 since the electromechanical response based on the piezoelectric coefficient d 33 would diverge in the vicinity of the Curie temperature.…”

Section: Introductionmentioning

confidence: 95%

Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

2002

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In order to determine the origin of image contrast in piezoresponse force microscopy (PFM), analytical descriptions of the complex interactions between a small tip and ferroelectric surface are derived for several sets of limiting conditions. Image charge calculations are used to determine potential and field distributions at the tip-surface junction between a spherical tip and an anisotropic dielectric half plane. Methods of Hertzian mechanics are used to calculate the response amplitude in the electrostatic regime. In the electromechanical regime, the limits of strong (classical) and weak (field-induced) indentation are established and the relative contributions of electroelastic constants are determined. These results are used to construct ''piezoresponse contrast mechanism maps'' that correlate the imaging conditions with the PFM contrast mechanisms. Conditions for quantitative PFM imaging are set forth. Variable-temperature PFM imaging of domain structures in BaTiO 3 and the temperature dependence of the piezoresponse are compared with GinzburgDevonshire theory. An approach to the simultaneous acquisition of piezoresponse and surface potential images is proposed. In order to determine the origin of image contrast in piezoresponse force microscopy ͑PFM͒, analytical descriptions of the complex interactions between a small tip and ferroelectric surface are derived for several sets of limiting conditions. Image charge calculations are used to determine potential and field distributions at the tip-surface junction between a spherical tip and an anisotropic dielectric half plane. Methods of Hertzian mechanics are used to calculate the response amplitude in the electrostatic regime. In the electromechanical regime, the limits of strong ͑classical͒ and weak ͑field-induced͒ indentation are established and the relative contributions of electroelastic constants are determined. These results are used to construct ''piezoresponse contrast mechanism maps'' that correlate the imaging conditions with the PFM contrast mechanisms. Conditions for quantitative PFM imaging are set forth. Variable-temperature PFM imaging of domain structures in BaTiO 3 and the temperature dependence of the piezoresponse are compared with Ginzburg-Devonshire theory. An approach to the simultaneous acquisition of piezoresponse and surface potential images is proposed.

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Section: Introductionmentioning

confidence: 95%

Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

2002

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“…SPM has been successfully applied to semiconductor, 19 organic, 20 and ferroelectric 21,22 surfaces, as well as to defects, 23,24 and photoinduced 25,26 and thermal phenomena 27,28 in these materials. A number of SPM studies on grain boundary related phenomena have also been reported.…”

Section: Introductionmentioning

confidence: 99%

Potential and Impedance Imaging of Polycrystalline BiFeO₃ Ceramics

Kalinin

Suchomel

Davies

et al. 2002

Journal of the American Ceramic Society

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Electrostatic-force-sensitive scanning probe microscopy (SPM) is used to investigate grain boundary behavior in polycrystalline BiFeO 3 ceramics. Scanning surface potential microscopy (SSPM) of a laterally biased sample exhibits potential drops due to resistive barriers at the grain boundaries. In this technique, the tips acts as a moving voltage probe detecting local variations of potential associated with the ohmic losses within the grains and at the grain boundaries. An approach for the quantification of grain boundary, grain interior, and contact resistivity from SSPM data is developed. Scanning impedance microscopy (SIM) is used to visualize capacitive barriers at the grain boundaries. In SIM, a dc-biased tip detects the variations of local potential induced by the lateral ac voltage applied to the sample. Unlike the traditional dc and ac transport measurement, both of these techniques are sensitive to the variation of local potential (SSPM) or local voltage oscillation amplitude and phase (SIM), rather than to current. Therefore, special attention is paid to the relationship between SSPM and SIM images and data obtained from traditional impedance spectroscopy and dc transport measurements. For BiFeO 3 ceramics excellent agreement between the local SIM measurements and impedance spectroscopy data are demonstrated.

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“…Numerous observations of local domain dynamics as related to polarization switching, fatigue, phase transitions, etc., have been made. [2][3][4][5][6][7][8][9][10][11][12][13] Especially of interest are spectroscopic variants of PFM, in which ramping of direct current (dc) voltage offset on the tip V dc allows local hysteresis loops to be acquired.…”

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confidence: 99%

Contrast Mechanism Maps for Piezoresponse Force Microscopy

Kalinin

Bonnell

2002

J. Mater. Res.

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Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation and local modification of ferroelectric domain structures on the submicron level. Both electrostatic and electromechanical interactions contribute at the tip-surface junction in a complex manner, which has resulted in multiple controversies in the interpretation of PFM. Here we analyze the influence of experimental conditions such as tip radius of curvature, indentation force, and cantilever stiffness on PFM image contrast. These results are used to construct contrast mechanism maps, which correlate the imaging conditions with the dominant contrast mechanisms. Conditions under which materials properties can be determined quantitatively are elucidated.

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In situobservation of the ferroelectric-paraelectric phase transition in a triglycine sulfate single crystal by variable-temperature electrostatic force microscopy

Cited by 62 publications

References 16 publications

Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

Potential and Impedance Imaging of Polycrystalline BiFeO₃ Ceramics

Contrast Mechanism Maps for Piezoresponse Force Microscopy

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In situobservation of the ferroelectric-paraelectric phase transition in a triglycine sulfate single crystal by variable-temperature electrostatic force microscopy

Cited by 62 publications

References 16 publications

Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

Potential and Impedance Imaging of Polycrystalline BiFeO3 Ceramics

Contrast Mechanism Maps for Piezoresponse Force Microscopy

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Potential and Impedance Imaging of Polycrystalline BiFeO₃ Ceramics