2012
DOI: 10.1021/ma2026429
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In Situ Measurement of Block Copolymer Ordering Kinetics during the Drying of Solution-Cast Films Using Small-Angle X-ray Scattering

Abstract: The ordering of a poly(styrene-b-butadiene) block copolymer solution into hexagonally packed cylinders during the extraction of a neutral solvent from a solution-cast film was studied in real time using in situ small-angle X-ray scattering (SAXS). By tracking changes in the scattering intensity as solvent is continually removed from the film, information on the ordering rate was obtained as the film progresses from the dilute to the concentrated regime. The ordering rate was found to be controlled by thermodyn… Show more

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Cited by 11 publications
(13 citation statements)
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References 53 publications
(83 reference statements)
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“…Other studies have examined the ODT 36−41 or the order−order transition (OOT) 42−45 kinetics in solvent/polymer systems at comparable quench depths while inducing the phase transformation by controlling temperature 37−45 or changing the solvent volume fraction. 36 Direct measurements of the segregation process, however, are difficult at quench depths beyond ∼10 °C33−35 due to the fast kinetics, and little work has been reported in this deeply metastable regime. Small-angle X-ray and neutron scattering has been extensively used to probe BCP segregation.…”
Section: ■ Introductionmentioning
confidence: 99%
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“…Other studies have examined the ODT 36−41 or the order−order transition (OOT) 42−45 kinetics in solvent/polymer systems at comparable quench depths while inducing the phase transformation by controlling temperature 37−45 or changing the solvent volume fraction. 36 Direct measurements of the segregation process, however, are difficult at quench depths beyond ∼10 °C33−35 due to the fast kinetics, and little work has been reported in this deeply metastable regime. Small-angle X-ray and neutron scattering has been extensively used to probe BCP segregation.…”
Section: ■ Introductionmentioning
confidence: 99%
“…Previous kinetic studies have followed the ODT in pure polymer systems for shallow quench depths on the order of ∼10 °C. Other studies have examined the ODT or the order–order transition (OOT) kinetics in solvent/polymer systems at comparable quench depths while inducing the phase transformation by controlling temperature or changing the solvent volume fraction . Direct measurements of the segregation process, however, are difficult at quench depths beyond ∼10 °C due to the fast kinetics, and little work has been reported in this deeply metastable regime.…”
Section: Introductionmentioning
confidence: 99%
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“…WAXS typically measures scattering from a q of approximately 10 -2 Å -1 to 10 1 Å -1 (nm to Å size scale analysis) [97][98][99]. Using in situ SAXS and WAXS during thermal annealing, BCP domain rearrangement has been studied on chemically-patterned substrates [100,101], during SVA [102], during electric field exposure [103,104], and upon drying after film casting [54,[105][106][107][108]. Notably, SAXS and WAXS examinations of BCP thin films are limited by the relatively small scattering volumes, the potential for radiation damage to the film, and inadvertent structural reorganization from sample interactions with X-rays [111][112][113].…”
Section: Transmission X-ray Scattering For In-plane Analysis Of Thin mentioning
confidence: 99%
“…For example, sample chambers with precise temperature control have facilitated in situ investigations of thermal annealing processes [160,174], while sample chambers with controlled solvent atmospheres and inline monitoring have been built to permit in situ SVA studies (see Figure 8a) [139,153,155]. Similar sample chambers and configurations have been constructed to probe the effects of electrical/magnetic fields [103,175], solvent drying from the film after SVA or casting [105,106], and UV exposure [176]. For example, Stegelmeier et al built a custom blade-casting apparatus to track the structural evolution of domains immediately after film casting via SAXS (see Figure 8b) [106].…”
Section: Sample Chambers For In Situ X-ray Scattering Analysismentioning
confidence: 99%