In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques

Abstract

A scanning force microscope for in situ nanofocused X-ray studies (SFINX) has been developed which can be installed on diffractometers at synchrotron beamlines allowing for the combination with various techniques such as coherent X-ray diffraction and fluorescence. The capabilities of this device are demonstrated on Cu nanowires and on Au islands grown on sapphire (0001). The sample topography, crystallinity, and elemental distribution of the same area are investigated by recording simultaneously an AFM image, a scanning X-ray diffraction map, and a fluorescence map. Additionally, the mechanical response of Au islands is studied by in situ indentation tests employing the AFM-tip and recording 2D X-ray diffraction patterns during mechanical loading.

Progress of in situ synchrotron X-ray diffraction studies on the mechanical behavior of materials at small scales

“…Bragg peak were monitored ( Fig. 42(d)) [215]. While the agreement between the topography and the fluorescence map demonstrates a perfect alignment of the AFM-tip and focused X-ray beam with respect to each other, the X-ray diffraction map reveals that only a small part of the nanowire fulfills the Bragg condition showing an imperfect crystallinity of the nanowire.…”