2009
DOI: 10.1088/0957-4484/20/17/175703
|View full text |Cite
|
Sign up to set email alerts
|

In situcomprehensive characterization of optoelectronic nanomaterials for device purposes

Abstract: We have combined optical fiber probe and nanoprobe techniques in a scanning electron microscope, which enables in situ optical, electrical and structural characterization of optoelectronic nanomaterials and nanodevices. The nanoprobe technique, employing sharp metal tips, is used for in situ nano-manipulation, contact and electrical measurement. The fiber probe, coupled to a spectrometer or a laser and controlled by a nano-manipulator, allows local optical detection or excitation. We show in situ assembly of a… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
14
0

Year Published

2010
2010
2021
2021

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 20 publications
(14 citation statements)
references
References 18 publications
0
14
0
Order By: Relevance
“…CL images show a marked dependence of the contrast on the detection angle. The capability of ARCL to characterize ZnO nanoscale waveguides by spectral measurements has been previously reported [15]. Also angular resolved photoluminescence has been used to study waveguide property of ZnO nanorods [16].…”
Section: Introductionmentioning
confidence: 98%
“…CL images show a marked dependence of the contrast on the detection angle. The capability of ARCL to characterize ZnO nanoscale waveguides by spectral measurements has been previously reported [15]. Also angular resolved photoluminescence has been used to study waveguide property of ZnO nanorods [16].…”
Section: Introductionmentioning
confidence: 98%
“…Cathodoluminescence spectrum of an individual comb-like structure was recorded using an in situ optical-electrical measurement system based on a Keithley 4200 semiconductor characterization system and an FEI XL30-SFEG SEM equipped with 4 Kleindiek MM3A nanomanipulators, and the current intensity of electron beam was less than 1nA. More details about the in situ optical-electrical measurement system can be found in [20].…”
Section: Methodsmentioning
confidence: 99%
“…Previous optical fiber PL sensing systems required two optical paths, in which one optical fiber probe was used for excitation laser delivery and the other was used for PL signal collection [11,12]. In these systems, the PL signal was collected by an additional bulk microscopic objective lens system [11].…”
Section: Theoretical Comparison Of Bifurcated Probe and Single Multi-mentioning
confidence: 99%