Abstract:In-situ characterization of composition, electronic structure and their depth profiles of surface of Cu(In1-xGax)Se2 (CIGS) film grown by three stage co-evaporation has been carried out by means of photoemission and inverse photoemission spectroscopy (PES/IPES), for the purpose of investigating the formation mechanism of the CIGS-side wide band-gap region adjacent to CBD-CdS/CIGS interface in cell structure. Sample-transportation in vacuum below 1 x 10-8 Torr yielded almost contamination-free feature of the CI… Show more
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