1981
DOI: 10.1063/1.2914772
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Experimental High-Resolution Electron Microscopy

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Cited by 304 publications
(177 citation statements)
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“…If we assume that the weak-phase object approximation holds, which is usually a reasonable approximation for single atoms (Spence, 1988), the exit wave function for an atom located at (projected) position (b x , b y ) is given by…”
Section: Exit Wavementioning
confidence: 99%
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“…If we assume that the weak-phase object approximation holds, which is usually a reasonable approximation for single atoms (Spence, 1988), the exit wave function for an atom located at (projected) position (b x , b y ) is given by…”
Section: Exit Wavementioning
confidence: 99%
“…The damping envelope function, incorporating the effect of temporal incoherence due to chromatic aberration (Spence, 1988), reads…”
Section: Transfer Functionmentioning
confidence: 99%
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“…The sample was studied by electron-optical and HREM techniques (Spence, 1981). The preparation of the electron-microscopy samples has previously been described (Lundberg & Sundberg, 1986).…”
Section: Methodsmentioning
confidence: 99%
“…If the diffraction experiments are performed in an electron microscope, an electron micrograph can be obtained from crystalline samples using a subset of diffracted beams. Essentially, an electron micrograph is an interference pattern formed by the selected subset of diffracted beams (Cowley, 1975;Spence, 1988). A Fourier transform of the electron micrograph then provides phases for the subset of low-resolution diffracted beams used in forming the image.…”
Section: V(r) = Zvgexp(ig'r)mentioning
confidence: 99%