1980
DOI: 10.1107/s0021889880012964
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EDINP, the Edinburgh powder profile refinement program

Abstract: A powder profile refinement program written specifically for the easy application of structural constraints is made generally available. It is based on ORFLS and written in Fortran IV. Details of the philosophy of the program are outlined, with emphasis on the areas where more research is necessary. Examples of usage in the literature are cited.

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Cited by 102 publications
(83 citation statements)
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“…The experimental powder diffraction profiles were analysed by means of the program EDINP (Pawley, 1980). In this modification of the Rietveld profile analysis program (Rietveld, 1969) the molecular orientation and the C-S bond length can be constrained during the initial cycles of refinement.…”
Section: Discussionmentioning
confidence: 99%
“…The experimental powder diffraction profiles were analysed by means of the program EDINP (Pawley, 1980). In this modification of the Rietveld profile analysis program (Rietveld, 1969) the molecular orientation and the C-S bond length can be constrained during the initial cycles of refinement.…”
Section: Discussionmentioning
confidence: 99%
“…A plethora of Rietveld-analysis computer programs has arisen apace with this dramatic increase in popularity of the method, as individual research groups either modified already established and widely circulated programs, such as those of Hewat (1973) and Wiles & Young (1981) or wrote new code from scratch (for example, Pawley, 1980;Von Dreele, Jorgensen & Windsor, 1982;Baerlocher, 1982;Izumi, 1985).…”
Section: Introductionmentioning
confidence: 99%
“…Thus, supplementary information is needed for a sufficiently good refinement of a crystal structure. Usually, it comes from: (a) elimination of some of the parameters as independent variables by constraining them to be functions of others (Immirzi, 1980;Pawley, 1980); (b) introduction of restraints on some geometric or energy parameters (Baerlocher, 1993;Elsenhans, 1990;Izumi, 1989); (c) the integration of an X-ray diffraction pattern with a neutron pattern. Such a practice is suggested by fact that X-rays and neutrons are scattered by different mechanisms (Larson & Von Dreele, 1987).…”
Section: Amount Of Information In a Powder Diagrammentioning
confidence: 99%