2014
DOI: 10.1021/ac5008128
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Hyphenating Atomic Force Microscopy

Abstract: Atomic force microscopy can be readily combined with complementary instrumental techniques ranging from optical to mass-sensitive methods. This Feature highlights recent advances on hyphenated AFM technology, which enables localized studies and mapping of complementary information at surfaces and interfaces.

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Cited by 26 publications
(15 citation statements)
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“…More advanced electrochemical methods, however, require longer exposition of a fresh HOPG surface to ambient air during the assembly of an electrochemical cell or even during the whole measurement. 10−13 Adventitious contamination has been considered as the cause of the heterogeneous electroactivity of the HOPG basal plane 14 and graphene/graphite flakes 15 as revealed by scanning electrochemical microscopy (SECM) 16,17 combined with atomic force microscopy (AFM). 18 In these SECM−AFM studies, a submicrometer-sized electrode was fabricated at the tip of an AFM cantilever to image the electrochemical reactivity of graphitic surfaces as well as their topography and conductivity.…”
mentioning
confidence: 99%
“…More advanced electrochemical methods, however, require longer exposition of a fresh HOPG surface to ambient air during the assembly of an electrochemical cell or even during the whole measurement. 10−13 Adventitious contamination has been considered as the cause of the heterogeneous electroactivity of the HOPG basal plane 14 and graphene/graphite flakes 15 as revealed by scanning electrochemical microscopy (SECM) 16,17 combined with atomic force microscopy (AFM). 18 In these SECM−AFM studies, a submicrometer-sized electrode was fabricated at the tip of an AFM cantilever to image the electrochemical reactivity of graphitic surfaces as well as their topography and conductivity.…”
mentioning
confidence: 99%
“…In addition, various combinations with other technology, including super-resolution optical microscopy, and Raman and IR spectroscopy have been generating scientifically intriguing results. 86 We expect that AFM force spectroscopy will further expand our knowledge and find use as a single-molecule analytical method in many fields.…”
Section: Resultsmentioning
confidence: 99%
“…As has been recently addressed in a critical review on SECM-based multi-functional imaging [35], with the development of hybrid scanning probe microscopy techniques complementary information about the evaluation of a sample is easily and simultaneously obtained. In this regard, concurrent imaging of enzyme activity by detection of enzymatic products during AFM examination of a surface was demonstrated [8,125]. The coupling of these two techniques provides tremendous benefits, allowing nanometre-resolution topographic mapping of the evaluated surface with the concomitant acquisition of electrochemical activity from the enzyme.…”
Section: Sg-tc Modementioning
confidence: 99%