Hyperspectral microscopy as a particle exposure assessment tool
Carolina Blanch-Perez-del-Notario,
Pieter Bertier,
Murali Jayapala
et al.
Abstract:Hyperspectral imaging combines the characteristics of computer vision and point spectroscopy by obtaining an image with both spatial and spectral information. Therefore, in combination with microscopy, it can increase material discrimination possibilities with respect to regular microscopy imaging. We explore this increased discrimination potential to assess exposure to particle contamination, since workplace exposure to specific particle materials poses wellknown health hazards. In this respect, we are focusi… Show more
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