2005
DOI: 10.1016/j.jcrysgro.2005.01.049
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Hydrothermal synthesis of porous FeIn2S4 microspheres and their electrochemical properties

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Cited by 29 publications
(9 citation statements)
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“…1, 23.4, 27.6, 28.8, 33.4, 43.8, 47.9, 50.4, 56.3, 59.8 and 67.1º correspond to the diffraction planes ( 111), ( 220), ( 311), ( 222), ( 400), ( 511), ( 440), ( 531), ( 533), ( 444) and ( 731), respectively. The diffraction patterns assigned to FeIn 2 S 4 are indexed to the cubic phase of FeIn 2 S 4 (JCPDS 80-0608), which is well agreement with the crystalline structure reported elsewhere (Chen et al 2005). The average crystallite size estimated by the Scherrer's equation was 21.7 nm.…”
Section: Characterization Of Fein 2 Ssupporting
confidence: 86%
“…1, 23.4, 27.6, 28.8, 33.4, 43.8, 47.9, 50.4, 56.3, 59.8 and 67.1º correspond to the diffraction planes ( 111), ( 220), ( 311), ( 222), ( 400), ( 511), ( 440), ( 531), ( 533), ( 444) and ( 731), respectively. The diffraction patterns assigned to FeIn 2 S 4 are indexed to the cubic phase of FeIn 2 S 4 (JCPDS 80-0608), which is well agreement with the crystalline structure reported elsewhere (Chen et al 2005). The average crystallite size estimated by the Scherrer's equation was 21.7 nm.…”
Section: Characterization Of Fein 2 Ssupporting
confidence: 86%
“…FeIn 2 S 4 NCs were prepared by means of a hydrothermal reaction method described in a previous study . As‐synthesized nanoparticles were cleaved into smaller size via sonication with N ‐methyl‐2‐pyrrolidone (NMP), such that charge transport was not hindered due to large interparticle distance but a densely packed film was formed ( Figure a and Figure S2 (Supporting Information)).…”
Section: Resultsmentioning
confidence: 99%
“…Materials : A previously reported procedure was followed to synthesize FeIn 2 S 4 microspheres . Because the size and morphology of the resulting materials was not yet suitable for use in the FET channel layer, the microspheres were cleaved and isolated by means of lengthy sonication in the solution phase (Figure S2, Supporting Information).…”
Section: Methodsmentioning
confidence: 99%
“…According to the JCPDS card no. 80‐0608, the diffraction peaks in Figure a can be indexed to the crystal planes of FeIn 2 S 4 . Corresponding to JCPDS card no.…”
Section: Figurementioning
confidence: 99%
“…XRD patterns (Figure 1a-c) were used to characterize the phase purity of samples.According to the JCPDS card no.80-0608, [17,21] the diffraction peaks in Figure 1acan be indexed to the crystal planes of FeIn 2 S 4 .C orresponding to JCPDS card no.7 9-1015, [17,18] the diffraction planes of CoIn 2 S 4 can be assigned to the peaks in Figure 1b.T he peaks in Figure 1c pertain to the diffraction planes of NiIn 2 S 4 ,matching well with JCPDS card no.70-2900. [17,18] XRD results prove preliminar- Table S1), and their XRD patterns (Supporting Information, Figure S1) indicate the successful fabrication of binary In 2.77 S 4 ,F eS 2 , CoS 2 ,and NiS/Ni 3 S 4 .…”
mentioning
confidence: 99%