1992
DOI: 10.12693/aphyspola.82.585
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Hydrogen Passivation in Semiconductors

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Cited by 12 publications
(3 citation statements)
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“…At the N/Si-edge, hydrogen binds strongly with E adH value of −3.3 eV. It has already been reported that the Si-p state, being the electron acceptor, is the possible lowest energy site for H passivation . The optimized structure of Si 2 BN saturated with one H atom (Si 2 BN-1H), and the corresponding SPDOS plot are presented in Figure a,b.…”
Section: Results and Discussionmentioning
confidence: 97%
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“…At the N/Si-edge, hydrogen binds strongly with E adH value of −3.3 eV. It has already been reported that the Si-p state, being the electron acceptor, is the possible lowest energy site for H passivation . The optimized structure of Si 2 BN saturated with one H atom (Si 2 BN-1H), and the corresponding SPDOS plot are presented in Figure a,b.…”
Section: Results and Discussionmentioning
confidence: 97%
“…It has already been reported that the Si-p state, being the electron acceptor, is the possible lowest energy site for H passivation. 54 The optimized structure of Si 2 BN saturated with one H atom (Si 2 BN-1H), and the corresponding SPDOS plot are presented in Figure 5a,b. In the optimized structure, the H atom prefers to be mostly at the Si-N bridge site.…”
Section: Resultsmentioning
confidence: 99%
“…The result can be explained as follows. Hydrogen induced passivation of B acceptors in Ge cores during post-annealing at 100°C, that is the formation of B-H complex [20], causes weakening the PL intensity which was enhanced with B-doping in as-prepared sample. And, at temperatures of 200°C and over, thermal dissociation of the B-H complex is promoted and results in recovery of the B-doping effect on the PL intensity accompanied with dangling-bond defect passivation.…”
Section: Resultsmentioning
confidence: 99%