2022
DOI: 10.1021/acsami.2c18094
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Hydrogen-Doping-Enabled Boosting of the Carrier Mobility and Stability in Amorphous IGZTO Transistors

Abstract: This study investigated the effect of hydrogen (H) on the performance of amorphous In–Ga–Zn–Sn oxide (a-In0.29Ga0.35Zn0.11Sn0.25O) thin-film transistors (TFTs). Ample H in plasma-enhanced atomic layer deposition (PEALD)-derived SiO2 can diffuse into the underlying a-IGZTO film during the postdeposition annealing (PDA) process, which affects the electrical properties of the resulting TFTs due to its donor behavior in the a-IGZTO. The a-In0.29Ga0.35Zn0.11Sn0.25O TFTs at the PDA temperature of 400 °C exhibited a … Show more

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Cited by 14 publications
(7 citation statements)
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References 66 publications
(93 reference statements)
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“…Both of these processes increase subgap states, leading to improved optical absorption. , By passivation of the defect states, hydrogen doping can also improve the mobility of the charge carriers. This allows for faster and more efficient transport of photogenerated carriers, leading to a higher photocurrent and quicker response times. , This is confirmed by the significantly increased photocurrents of the doped memristor, presented in Figure d–f. In fact, for 10 s illumination, the I light / I dark ratio increases from 1.3 to 12, from 14 to 93, and from 46 to 179 for wavelengths of 505, 405, and 365 nm, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Both of these processes increase subgap states, leading to improved optical absorption. , By passivation of the defect states, hydrogen doping can also improve the mobility of the charge carriers. This allows for faster and more efficient transport of photogenerated carriers, leading to a higher photocurrent and quicker response times. , This is confirmed by the significantly increased photocurrents of the doped memristor, presented in Figure d–f. In fact, for 10 s illumination, the I light / I dark ratio increases from 1.3 to 12, from 14 to 93, and from 46 to 179 for wavelengths of 505, 405, and 365 nm, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…To date, numerous studies have been reported to increase the μ FE in oxide TFTs using various approaches such as Sn-doped InGaZnO (IGZO), optimization of the cation composition, crystallization, heterojunctions, dual-gate structures, adjusting channel thickness, and postdeposition annealing (PDA) temperature. , Among them, the crystallization via the PDA is one of the simplest and the most effective approaches to improve the μ FE . However, the crystallization of oxide semiconductors with a ZnO component is generally accomplished at a high temperature (>700 °C) due to its corner-sharing crystal configuration different from In 2 O 3 and Ga 2 O 3 with an edge-sharing configuration crystal structure .…”
Section: Introductionmentioning
confidence: 99%
“…In this context, several approaches have been proposed to ensure high mobility AOS TFTs, such as heterojunction structures using quasi-two-dimensional electron gas (q2DEG) 5 , 11 , crystallization 10 , 12 , hydrogen doping 7 , and multi-gate architecture 14 19 . Amongst, adopting the multi-gate architecture, such as double-gate (DG), tri-gate and gate-all-around (GAA), is considered promising due to the outstanding current boosting ability.…”
Section: Introductionmentioning
confidence: 99%