2018
DOI: 10.1002/mmce.21555
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Hybrid small‐signal model parameter extraction of GaN HEMTs on Si and SiC substrates based on global optimization

Abstract: This article presents efficient parameters extraction procedure applied to GaN High electron mobility transistor (HEMT) on Si and SiC substrates. The method depends on combined technique of direct and optimization‐based to extract the elements of small‐signal equivalent circuit model (SSECM) for GaN‐on‐Si HEMT. The same model has been also applied to GaN‐on‐SiC substrate to evaluate the effect of the substrates on the model parameters. The quality of extraction was evaluated by means of S‐parameter fitting at … Show more

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Cited by 14 publications
(15 citation statements)
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“…The onset of the distributed effects [16], [17] and non-quasi-static (NQS) effects [18], [19] make the model extraction much more critical. Over the years, optimizationbased model identification has demonstrated to be a powerful modeling tool to accomplish this critical task [20][21][22][23][24].…”
Section: Introductionmentioning
confidence: 99%
“…The onset of the distributed effects [16], [17] and non-quasi-static (NQS) effects [18], [19] make the model extraction much more critical. Over the years, optimizationbased model identification has demonstrated to be a powerful modeling tool to accomplish this critical task [20][21][22][23][24].…”
Section: Introductionmentioning
confidence: 99%
“…However, at higher frequencies, especially for large device periphery, extra elements are required in the EC to account for the parasitic effects. In such a case, the direct extraction procedure are replaced by optimization or combination of direct and optimization techniques 23 …”
Section: Introductionmentioning
confidence: 99%
“…Meanwhile, the optimization method has the drawback that the extracted elements could be physically meaningless and rely heavily on the initial value, local minima, and also optimization technique itself. Hence, most researchers combine these two methods to develop hybrid parameter‐extraction method 9‐13 . Usually, some assumptions on the capacitance partitioning of intrinsic part for cold pinch‐off GaN device are used, such as C gs = C gd in References 10 and 11 and three identical capacitances C b in 12 .…”
Section: Introductionmentioning
confidence: 99%