HV ESD Device Solution Evaluations in 55nm BCD Technology

Karalkar, Sagar; Paul, Milova; Low, Xiao Mei Elaine; Hwang, Kyong Jin; Gauthier, Robert

doi:10.1109/ipfa53173.2021.9617387

2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2021

DOI: 10.1109/ipfa53173.2021.9617387

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HV ESD Device Solution Evaluations in 55nm BCD Technology

Sagar Karalkar

Milova Paul

Xiao Mei Elaine Low

et al.

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HV ESD Device Solution Evaluations in 55nm BCD Technology

Cited by 1 publication

References 10 publications

ESD Capability Analysis of High-voltage nLDMOSs by the Bulk Terminal Modulation

ESD Capability Analysis of High-voltage nLDMOSs by the Bulk Terminal Modulation

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