2016 IEEE 8th International Power Electronics and Motion Control Conference (IPEMC-ECCE Asia) 2016
DOI: 10.1109/ipemc.2016.7512796
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Humidity testing of SiC power MOSFETs

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Cited by 10 publications
(9 citation statements)
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“…The root causes of SF are temperature swings, humidity, average temperature level and temperature variations and, hence, very similar to those of BWLO. In terms of ALC, IGBTs are not sealed against humidity and their silicone gel is not impermeable to moisture [22]. Thus, especially in offshore WTs, an increase of humidity causes an increase of the electric field at the edge terminals of the IGBTs and leads to the corrosion of solder joints [23].…”
Section: Failure Mechanisms Of Igbt Modulesmentioning
confidence: 99%
See 2 more Smart Citations
“…The root causes of SF are temperature swings, humidity, average temperature level and temperature variations and, hence, very similar to those of BWLO. In terms of ALC, IGBTs are not sealed against humidity and their silicone gel is not impermeable to moisture [22]. Thus, especially in offshore WTs, an increase of humidity causes an increase of the electric field at the edge terminals of the IGBTs and leads to the corrosion of solder joints [23].…”
Section: Failure Mechanisms Of Igbt Modulesmentioning
confidence: 99%
“…In terms of ALC, IGBTs are not sealed against humidity and their silicone gel is not impermeable to moisture [22]. Thus, especially in offshore WTs, an increase of humidity causes an increase of the electric field at the edge terminals of the IGBTs and leads to the corrosion of solder joints [23]. Another destructive effect of moisture is the expansion of small cracks due to the surge of pressure inside the module during soldering [24].…”
Section: Failure Mechanisms Of Igbt Modulesmentioning
confidence: 99%
See 1 more Smart Citation
“…However, it is greatly different between the simulation results and the actual operational results. Another is fault statistics or reliability studies based on field data usually focus on power devices [4][5]. However, this type of studies requires a large amount of long-term data collection and statistics, and it has a strong regional specificity.…”
Section: Introductionmentioning
confidence: 99%
“…In fact, it is hard to simulate all operational conditions because of the restricted laboratory conditions and the large number of operational conditions. The literature [4] has carried out an analysis to identify the relative humidity is one of the root causes and driving factors of faults in MOSFETs. However, the relative humidity is not considered into the operational reliability evaluation of photovoltaic (PV) inverters.…”
Section: Introductionmentioning
confidence: 99%