2020
DOI: 10.1021/acs.jpclett.0c00229
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How Bulk Sensitive is Hard X-ray Photoelectron Spectroscopy: Accounting for the Cathode–Electrolyte Interface when Addressing Oxygen Redox

Abstract: Sensitivity to the "bulk" oxygen core orbital makes hard X-ray photoelectron spectroscopy (HAXPES) an appealing technique for studying oxygen redox candidates. Various studies have reported an additional O 1s peak (530−531 eV) at high voltages, which has been considered a direct signature of the bulk oxygen redox process. Here, we find the emergence of a 530.4 eV O 1s HAXPES peak for three model cathodesLi 2 MnO 3 , Li-rich NMC, and NMC 442that shows no clear link to oxygen redox. Instead, the 530.4 eV peak … Show more

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Cited by 39 publications
(44 citation statements)
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“…HAXPES has gained recent popularity in the analysis of battery materials because it offers surface analysis at deeper locations than that by XPS. [38][39][40][41] XPS with Ar sputtering can be used to perform depth analysis, but redeposition and decomposition of the sample will occur and must be taken into consideration. The Li1s and C1s XPS and HAXPES spectra of the substrate obtained in the electrolyte with 100 ppm water are given in Figure 9.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…HAXPES has gained recent popularity in the analysis of battery materials because it offers surface analysis at deeper locations than that by XPS. [38][39][40][41] XPS with Ar sputtering can be used to perform depth analysis, but redeposition and decomposition of the sample will occur and must be taken into consideration. The Li1s and C1s XPS and HAXPES spectra of the substrate obtained in the electrolyte with 100 ppm water are given in Figure 9.…”
Section: Resultsmentioning
confidence: 99%
“…The surface film of densely packed lithium obtained in the electrolyte with 100 ppm water was evaluated using XPS and hard X‐ray photoelectron spectroscopy (HAXPES). HAXPES has gained recent popularity in the analysis of battery materials because it offers surface analysis at deeper locations than that by XPS [38–41] . XPS with Ar sputtering can be used to perform depth analysis, but redeposition and decomposition of the sample will occur and must be taken into consideration.…”
Section: Resultsmentioning
confidence: 99%
“…All the TEY and TFY data of total 55 samples are provided in Figures . Because the surface signals may not be intrinsic to the electrode material property and could vary upon electrochemical cycling, [ 32 ] our analysis in this work focuses on the relatively bulk‐sensitive TFY spectra, especially for samples displaying the contrasts between surface and bulk signals, as also mentioned in .…”
Section: Methodsmentioning
confidence: 99%
“…$4.5 V Li + /Li ). [8][9][10] Among these compounds, Li-and Mn-rich layered oxides (LMLOs) are at the forefront of this area achieving high discharge capacities above 250 mA h g À1 . 11,12 However, the oxygen redox activity always causes changes in the crystallographic structure, surface inhomogeneity and release of lattice oxygen in LMLOs, thereby resulting in structural instability and severe voltage fading.…”
Section: Introductionmentioning
confidence: 99%