2019
DOI: 10.1364/prj.7.000193
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Hot-wire chemical vapor deposition low-loss hydrogenated amorphous silicon waveguides for silicon photonic devices

Abstract: We demonstrate low-loss hydrogenated amorphous silicon (a-Si:H) waveguides by hot-wire chemical vapor deposition (HWCVD). The effect of hydrogenation in a-Si at different deposition temperatures has been investigated and analyzed by Raman spectroscopy. We obtained an optical quality a-Si:H waveguide deposited at 230°C that has a strong Raman peak shift at 480 cm −1 , peak width (full width at half-maximum) of 68.9 cm −1 , and bond angle deviation of 8.98°. Optical transmission measurement shows a low propagati… Show more

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Cited by 18 publications
(11 citation statements)
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References 43 publications
(60 reference statements)
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“…The design of the grating couplers allowed coupling of TE mode polarization only. Our measured propagation loss for a straight a-Si:H waveguide for 650 nm (w) by 400 nm (h) waveguide dimensions is 0.8 dB/cm [20].…”
Section: Measurement Results and Discussionmentioning
confidence: 87%
See 1 more Smart Citation
“…The design of the grating couplers allowed coupling of TE mode polarization only. Our measured propagation loss for a straight a-Si:H waveguide for 650 nm (w) by 400 nm (h) waveguide dimensions is 0.8 dB/cm [20].…”
Section: Measurement Results and Discussionmentioning
confidence: 87%
“…The main advantage of using the HWCVD tool in our work over plasma-enhanced chemical vapour deposition (PECVD) is the effective dissociation of the precursor gas, i.e., silane (SiH 4 ), into atomic silicon (Si) and hydrogen (H 2 ) molecules, by the hot filaments which reduces film stress due to the absence of plasma ion bombardment [19]. Thus, this allows high quality HWCVD a-Si:H thin film to be attainable at low temperature below 400°C for Back End of Line (BEOL) process compatibility [20]. In this paper, we demonstrate the fabrication and characterization of HWCVD a-Si:H interlayer slope waveguides.…”
Section: Introductionmentioning
confidence: 99%
“…A relatively new version of the CVD process, which has recently gained popularity to deposit various materials on planar substrates for the fabrication of photonic components, [91,92] is hot-wire CVD (HWCVD). A schematic configuration for the HWCVD process is shown in Figure 7c, where the precursors decompose on the hot filament to produce the deposition species.…”
Section: Primary Deposition and Growth Methods For Group IV Semiconductor Thin Filmsmentioning
confidence: 99%
“…16 Despite the excellent Kerr nonlinearity of a-Si:H, the lowest reported a-Si:H linear propagation losses are about an order of magnitude higher than Si 3 N 4 . 21 In a quantum application, even with the high nonlinearity that allows a-Si:H to efficiently generate photon pairs, the high propagation loss of a-Si:H waveguides results in many of the photon pairs being lost onchip before off-chip detection. This dramatically reduces the coincidence-to-accidental rate that can be observed and severely limits its quantum applications.…”
Section: ■ Introductionmentioning
confidence: 99%
“…Contending with crystalline silicon (c-Si), a-Si:H can be easily deposited at a lower temperature and thus incorporated in massive chip manufacturing processes 16. Despite the excellent Kerr nonlinearity of a-Si:H, the lowest reported a-Si:H linear propagation losses are about an order of magnitude higher than Si 3 N 4 21. In a quantum application, even with the high nonlinearity that allows a-Si:H to efficiently generate photon pairs, the high propagation loss of a-Si:H waveguides results in many of the photon pairs being lost onchip before off-chip detection.…”
mentioning
confidence: 99%