2021
DOI: 10.1021/acs.jpcc.1c06371
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Host-to-Guest Energy Transfer and Its Role in the Lower Stability of Solution-Coated versus Vacuum-Deposited Phosphorescent OLEDs

Abstract: Electroluminescence (EL) degradation mechanisms in solution-coated (SOL) host:guest (H:G) systems commonly used in phosphorescent organic light-emitting diodes (OLEDs) are investigated and compared to their vacuum-deposited (VAC) counterparts. Changes in the EL, photoluminescence (PL), and time-resolved PL (TRPL) characteristics of devices comprising SOL or VAC H:G light-emitting layers (EMLs) made of the same materials and in the same device architectures during prolonged electrical driving are compared and a… Show more

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Cited by 6 publications
(10 citation statements)
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“…Moreover, both devices exhibit an LT50 of about 20 h (for an L 0 of 6000 cd m –2 ). These results prove that the solvent exposure does not affect device performance or lifetime and establish the solvent resistance of ITO/HAT-CN/VB-FNPD layers and interfaces for subsequent experiments …”
Section: Resultssupporting
confidence: 57%
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“…Moreover, both devices exhibit an LT50 of about 20 h (for an L 0 of 6000 cd m –2 ). These results prove that the solvent exposure does not affect device performance or lifetime and establish the solvent resistance of ITO/HAT-CN/VB-FNPD layers and interfaces for subsequent experiments …”
Section: Resultssupporting
confidence: 57%
“…These results prove that the solvent exposure does not affect device performance or lifetime and establish the solvent resistance of ITO/HAT-CN/VB-FNPD layers and interfaces for subsequent experiments. 19 Previous work showed that increasing the guest concentration can lead to increased stability due to enhanced host-toguest energy transfer and thus reduced exciton stress in wide band gap host materials. 20,24 Therefore, we also tested and compared the EL stability of a similar set of devices with 10 wt % guest concentration.…”
Section: Resultsmentioning
confidence: 99%
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