2018
DOI: 10.1063/1.5023695
|View full text |Cite
|
Sign up to set email alerts
|

Homogeneous molybdenum disulfide tunnel diode formed via chemical doping

Abstract: We report on a simple, controllable chemical doping method to fabricate a lateral homogeneous MoS2 tunnel diode. MoS2 was doped to degenerate n- (1.6 × 1013 cm−2) and p-type (1.1 × 1013 cm−2) by benzyl viologen and AuCl3, respectively. The n- and p-doping can be patterned on the same MoS2 flake, and the high doping concentration can be maintained by Al2O3 masking together with vacuum annealing. A forward rectifying p-n diode and a band-to-band tunneling induced backward rectifying diode were realized by modula… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

1
19
0

Year Published

2019
2019
2022
2022

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 15 publications
(20 citation statements)
references
References 18 publications
1
19
0
Order By: Relevance
“…Liu reported PVCR < 2, and I P~5 0 nA/µm. The measured peak voltage (V P ) by Pang 19 was~1.5 V, and Liu 20 reported 0.8 V, which is well above what is expected in an Esaki tunnel junction, V P ≈ (Φ n + Φ p )/2 (with Φ n and Φ p being the electron and hole degeneracies, respectively). The difference between the expected V P and its measured value suggests an additional voltage drop in the current path of these devices to account for the high V P .…”
Section: Introductionmentioning
confidence: 65%
See 2 more Smart Citations
“…Liu reported PVCR < 2, and I P~5 0 nA/µm. The measured peak voltage (V P ) by Pang 19 was~1.5 V, and Liu 20 reported 0.8 V, which is well above what is expected in an Esaki tunnel junction, V P ≈ (Φ n + Φ p )/2 (with Φ n and Φ p being the electron and hole degeneracies, respectively). The difference between the expected V P and its measured value suggests an additional voltage drop in the current path of these devices to account for the high V P .…”
Section: Introductionmentioning
confidence: 65%
“…6e, the peak voltages are now shifted in the 0.2-0.3 V range, with significantly lower voltages in comparison to the reports of Pang 19 and Liu. 20 Doping levels of~2.8 × 10 13 cm −2 are inferred assuming that the measured minimum V P corresponds to the junction degeneracy, Fig. 4).…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…metal oxides [70,121,[139][140][141], metal halide [125][126][127][128][129][130], organic molecules [125, 134-136, 146, 149, 150, 152], etc. Surface deposition/coating has the advantages of patterned doping capability, relative low doping temperature, and little crystal damage [129,133,134,153].…”
Section: Surface Deposition/coatingmentioning
confidence: 99%
“…One of the Lewis acids, AuCl3, is the most commonly used for the p-type doping process (Fig. 6(f)) [124][125][126][127][128][129][130]. AuCl4ions in AuCl3 solution would capture the electrons in TMDCs, then the Fermi-level of TMDCs moves to its valence band and leads to the p-type doping result [154].…”
Section: Surface Deposition/coatingmentioning
confidence: 99%