This paper deals with the incorporation of temperature‐sensitive InGaN quantum dot (QD) ensembles into separate confinement double heterostructures grown on free‐standing GaN substrates. The laser diode (LD) structures were processed as ridge waveguide devices. The emission wavelength in electroluminescence (EL) of the 3 fold QD layers is around 485 nm.
The structural quality and state of strain of the layers has been determined by high resolution X‐ray diffraction (HRXRD) measurements. Current‐voltage characteristics, light output power measurements and EL‐spectra demonstrate the good stability of the device. A comparable small blue shift was observed with increasing excitation current (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)