2013
DOI: 10.1063/1.4802449
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Hole transport in single crystal synthetic diamond at low temperatures

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Cited by 15 publications
(15 citation statements)
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“…This NDM is due to the previously described valley repopulation. Figure 3 shows the measured drift velocity for electrons (and holes, for comparison) at 120 K. It may also be noted from Figure 3 that hole transport behaves very differently from electron transport, and indeed no NDM can be observed for hole transport at any temperature for which we have performed measurements (5-500 K) [19]. This is to be expected.…”
Section: Methodsmentioning
confidence: 59%
See 1 more Smart Citation
“…This NDM is due to the previously described valley repopulation. Figure 3 shows the measured drift velocity for electrons (and holes, for comparison) at 120 K. It may also be noted from Figure 3 that hole transport behaves very differently from electron transport, and indeed no NDM can be observed for hole transport at any temperature for which we have performed measurements (5-500 K) [19]. This is to be expected.…”
Section: Methodsmentioning
confidence: 59%
“…The ToF technique can also be used to measure carrier lifetimes [6,17] and to extract the electric field distribution in particle detectors and device structures [18]. Our group has used the ToF technique with low-intensity pulsed UV excitation to study charge transport in single-crystalline CVD diamond over a wide range of temperatures (5-500 K) [9,13,19]. At temperatures above 150 K, the drift velocities of holes and electrons exhibit a similar behaviour as functions of the applied electric field [9].…”
Section: Introductionmentioning
confidence: 99%
“…Recently, similar measurements were performed at lower temperatures under photo‐injection by Majdi et al. () or under alpha‐particle injection by Jansen et al. ().…”
Section: Previous Reports On Charge‐carrier and Exciton Transportmentioning
confidence: 60%
“…Recently, measurements of time-of-flight (TOF) transport [2,10,17,18] and optical transient grating [19,20] have been performed with the highly pure crystals. However, the measured carrier mobility varied from sample to sample depending on the surface termination condition, the crystal supplier, and experimental conditions.…”
Section: Introductionmentioning
confidence: 99%